{"id":14962,"date":"2022-09-25T08:35:49","date_gmt":"2022-09-25T08:35:49","guid":{"rendered":"https:\/\/newsite.com\/ausruestung\/halbleiter-sensor-einzelne-komponenten\/test-und-abschluss\/burn-in\/"},"modified":"2024-01-25T15:17:36","modified_gmt":"2024-01-25T15:17:36","slug":"einbrennen","status":"publish","type":"page","link":"https:\/\/4jmsolutions.com\/de\/ausruestung\/halbleiter-sensor-einzelne-komponenten\/pruefung-und-fertigstellung\/einbrennen\/","title":{"rendered":"Burn-In"},"content":{"rendered":"\t\t<div data-elementor-type=\"wp-page\" data-elementor-id=\"14962\" class=\"elementor elementor-14962\" data-elementor-post-type=\"page\">\n\t\t\t\t\t\t<section data-particle_enable=\"false\" data-particle-mobile-disabled=\"false\" class=\"elementor-section elementor-top-section elementor-element elementor-element-3fa6ed37 elementor-section-stretched elementor-section-boxed elementor-section-height-default elementor-section-height-default\" data-id=\"3fa6ed37\" data-element_type=\"section\" data-settings=\"{&quot;stretch_section&quot;:&quot;section-stretched&quot;,&quot;animation&quot;:&quot;none&quot;}\">\n\t\t\t\t\t\t<div class=\"elementor-container elementor-column-gap-default\">\n\t\t\t\t\t<div class=\"elementor-column elementor-col-50 elementor-top-column elementor-element elementor-element-3c02071f\" data-id=\"3c02071f\" data-element_type=\"column\">\n\t\t\t<div class=\"elementor-widget-wrap elementor-element-populated\">\n\t\t\t\t\t\t<div class=\"elementor-element elementor-element-3358cf1c elementor-widget elementor-widget-text-editor\" data-id=\"3358cf1c\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t<style>\/*! elementor - v3.19.0 - 28-02-2024 *\/\n.elementor-widget-text-editor.elementor-drop-cap-view-stacked .elementor-drop-cap{background-color:#69727d;color:#fff}.elementor-widget-text-editor.elementor-drop-cap-view-framed .elementor-drop-cap{color:#69727d;border:3px solid;background-color:transparent}.elementor-widget-text-editor:not(.elementor-drop-cap-view-default) .elementor-drop-cap{margin-top:8px}.elementor-widget-text-editor:not(.elementor-drop-cap-view-default) .elementor-drop-cap-letter{width:1em;height:1em}.elementor-widget-text-editor .elementor-drop-cap{float:left;text-align:center;line-height:1;font-size:50px}.elementor-widget-text-editor .elementor-drop-cap-letter{display:inline-block}<\/style>\t\t\t\t<h5><span style=\"font-weight: 400;\">Burn-in Test<\/span><\/h5><p>In der Halbleiterfertigung sind Burn-In-Tests ein wichtiges Verfahren, um vorzeitige Ausf\u00e4lle von Bauelementen zu verhindern und sicherzustellen, dass nur die zuverl\u00e4ssigsten Produkte den Weg zum Endkunden finden. Im Wesentlichen geht es bei einem Burn-in-Test darum, ein Bauteil Bedingungen auszusetzen, die \u00fcber seine normalen Betriebsparameter hinausgehen, um m\u00f6gliche Ausf\u00e4lle zu beschleunigen. Dies kann durch Herstellungsfehler oder andere Anomalien verursacht werden. Das Ziel ist einfach: Schwachstellen zu erkennen und zu beseitigen, um eine lange Lebensdauer und Zuverl\u00e4ssigkeit zu gew\u00e4hrleisten.<\/p><p>Eine der herausragenden Maschinen von <span style=\"font-weight: 400;\"><img decoding=\"async\" class=\"alignnone wp-image-12859\" src=\"https:\/\/4jmsolutions.com\/wp-content\/uploads\/2022\/10\/logo-carets-300x158.png\" alt=\"\" width=\"22\" height=\"12\" srcset=\"https:\/\/4jmsolutions.com\/wp-content\/uploads\/2022\/10\/logo-carets-300x158.png 300w, https:\/\/4jmsolutions.com\/wp-content\/uploads\/2022\/10\/logo-carets.png 512w\" sizes=\"(max-width: 22px) 100vw, 22px\" \/><\/span>4JMSolutions, die f\u00fcr diesen kritischen Test ma\u00dfgeschneidert ist, ist die Trooper-BI Wafer-Level VCSEL\/LED\/Micro LED Burn-In Test System-Maschine. Diese sofort einsatzbereite L\u00f6sung ist in der Lage, VCSEL-LED-Substrate auf Wafer-Ebene zu testen und Burn-In-Tests durchzuf\u00fchren. Mit der M\u00f6glichkeit, bis zu 7.200 Pr\u00fcflinge gleichzeitig bei einer kontrollierten Temperatur von bis zu 135\u00b0C zu testen, zeichnet sie sich durch ihre Pr\u00e4zision und Skalierbarkeit aus. Diese gro\u00df angelegten Tests werden durch ein integriertes Wasserk\u00fchlsystem, ein Leckerkennungssystem und ein wachsames Temperatur\u00fcberwachungssystem unterst\u00fctzt, um die Sicherheit und Integrit\u00e4t des Prozesses zu gew\u00e4hrleisten.<\/p><p>F\u00fcr Leistungsbauelemente bietet die Wafer-Level Power Device Burn-In-Maschine innovative L\u00f6sungen. Durch die parallele Verarbeitung von 2 Wafern k\u00f6nnen 480 Chips pro Wafer gleichzeitig getestet werden. Sie verf\u00fcgt \u00fcber unabh\u00e4ngige Treiberkan\u00e4le, die eine gleichzeitige Spannungs-\/Strommessung und Temperatur\u00fcberwachung erm\u00f6glichen. Das hochmoderne Design beinhaltet eine geschlossene Kammer, die Inertgase wie Stickstoff enth\u00e4lt, um sicherzustellen, dass die Pr\u00fcflinge vor Lichtb\u00f6gen und Oxidation gesch\u00fctzt sind. Diese innovative Funktion stellt sicher, dass das Ger\u00e4t eine optimale Betriebstemperatur beibeh\u00e4lt und das Risiko einer \u00dcberhitzung ausgeschlossen ist.<\/p><p>Burn-In-Sortiermaschinen wie die JTS-8700, JTS-30000, JTS-8500 und Eagle S8800 rationalisieren den Sortierprozess nach dem Burn-In-Test. Bei diesen Maschinen geht es nicht nur um das Testen, sondern auch um Pr\u00e4zision bei der Handhabung, dem Be- und Entladen der ICs. Mit einem breiten Spektrum an Kompatibilit\u00e4ten &#8211; von BGA und CSP bis hin zu QFP und QFN &#8211; gew\u00e4hrleisten sie eine effiziente Sortierung. Die Zuverl\u00e4ssigkeit dieser Maschinen wird durch die einfach zu navigierenden MMI-Men\u00fcs noch verst\u00e4rkt, die eine benutzerfreundliche Bedienung und Wartung gew\u00e4hrleisten.<\/p>\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t<div class=\"elementor-column elementor-col-50 elementor-top-column elementor-element elementor-element-49db607f\" data-id=\"49db607f\" data-element_type=\"column\">\n\t\t\t<div class=\"elementor-widget-wrap elementor-element-populated\">\n\t\t\t\t\t\t<div class=\"elementor-element elementor-element-52103216 elementor-widget elementor-widget-image-gallery\" data-id=\"52103216\" data-element_type=\"widget\" data-widget_type=\"image-gallery.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t<style>\/*! elementor - v3.19.0 - 28-02-2024 *\/\n.elementor-image-gallery .gallery-item{display:inline-block;text-align:center;vertical-align:top;width:100%;max-width:100%;margin:0 auto}.elementor-image-gallery 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elementor-grid-item post-15743 page type-page status-publish has-post-thumbnail hentry\">\n\t\t\t\t<a class=\"elementor-post__thumbnail__link\" href=\"https:\/\/4jmsolutions.com\/de\/ausruestung\/halbleiter-sensor-einzelne-komponenten\/pruefung-und-fertigstellung\/einbrennen\/module-level-power-device-burn-in-handler\/\" tabindex=\"-1\" >\n\t\t\t<div class=\"elementor-post__thumbnail\"><img decoding=\"async\" width=\"635\" height=\"463\" src=\"https:\/\/4jmsolutions.com\/wp-content\/uploads\/2022\/11\/module-level-power-device-burn-in-test-handler-thumbnail.png\" class=\"attachment-full size-full wp-image-13456\" alt=\"\" srcset=\"https:\/\/4jmsolutions.com\/wp-content\/uploads\/2022\/11\/module-level-power-device-burn-in-test-handler-thumbnail.png 635w, https:\/\/4jmsolutions.com\/wp-content\/uploads\/2022\/11\/module-level-power-device-burn-in-test-handler-thumbnail-300x219.png 300w\" sizes=\"(max-width: 635px) 100vw, 635px\" \/><\/div>\n\t\t<\/a>\n\t\t\t\t<div class=\"elementor-post__text\">\n\t\t\t\t<h3 class=\"elementor-post__title\">\n\t\t\t<a href=\"https:\/\/4jmsolutions.com\/de\/ausruestung\/halbleiter-sensor-einzelne-komponenten\/pruefung-und-fertigstellung\/einbrennen\/module-level-power-device-burn-in-handler\/\" >\n\t\t\t\tModule-Level Power Device Burn-in Handler\t\t\t<\/a>\n\t\t<\/h3>\n\t\t\t\t<div class=\"elementor-post__excerpt\">\n\t\t\t<p>Module-Level Power Device Burn-in Handler Bei diesem System handelt es sich um das neueste, auf dem Markt erh\u00e4ltliche Burn-In-Testsystem auf Modulebene f\u00fcr Leistungsger\u00e4te. Seine innovative<\/p>\n\t\t<\/div>\n\t\t\t\t\t<div class=\"elementor-post__read-more-wrapper\">\n\t\t\n\t\t<a class=\"elementor-post__read-more\" href=\"https:\/\/4jmsolutions.com\/de\/ausruestung\/halbleiter-sensor-einzelne-komponenten\/pruefung-und-fertigstellung\/einbrennen\/module-level-power-device-burn-in-handler\/\" aria-label=\"Read more about Module-Level Power Device Burn-in Handler\" tabindex=\"-1\" >\n\t\t\tRead More \u00bb\t\t<\/a>\n\n\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/article>\n\t\t\t\t<article class=\"elementor-post elementor-grid-item post-15732 page type-page status-publish has-post-thumbnail hentry\">\n\t\t\t\t<a class=\"elementor-post__thumbnail__link\" href=\"https:\/\/4jmsolutions.com\/de\/ausruestung\/halbleiter-sensor-einzelne-komponenten\/pruefung-und-fertigstellung\/einbrennen\/wafer-level-power-device-burn-in-handler\/\" tabindex=\"-1\" >\n\t\t\t<div class=\"elementor-post__thumbnail\"><img loading=\"lazy\" decoding=\"async\" width=\"635\" height=\"463\" src=\"https:\/\/4jmsolutions.com\/wp-content\/uploads\/2022\/11\/wafer-level-power-device-burn-in-test-handler-thumbnail.png\" class=\"attachment-full size-full wp-image-13454\" alt=\"\" srcset=\"https:\/\/4jmsolutions.com\/wp-content\/uploads\/2022\/11\/wafer-level-power-device-burn-in-test-handler-thumbnail.png 635w, https:\/\/4jmsolutions.com\/wp-content\/uploads\/2022\/11\/wafer-level-power-device-burn-in-test-handler-thumbnail-300x219.png 300w\" sizes=\"(max-width: 635px) 100vw, 635px\" \/><\/div>\n\t\t<\/a>\n\t\t\t\t<div class=\"elementor-post__text\">\n\t\t\t\t<h3 class=\"elementor-post__title\">\n\t\t\t<a href=\"https:\/\/4jmsolutions.com\/de\/ausruestung\/halbleiter-sensor-einzelne-komponenten\/pruefung-und-fertigstellung\/einbrennen\/wafer-level-power-device-burn-in-handler\/\" >\n\t\t\t\tWafer-Level Power device Burn-in Handler\t\t\t<\/a>\n\t\t<\/h3>\n\t\t\t\t<div class=\"elementor-post__excerpt\">\n\t\t\t<p>Wafer-Level Power device Burn-in Handler Bei diesem System handelt es sich um das neueste, f\u00fcr Leistungsbauelemente entwickelte Burn-In-Testsystem auf Wafer-Ebene. Dieser innovative Tester bietet die<\/p>\n\t\t<\/div>\n\t\t\t\t\t<div class=\"elementor-post__read-more-wrapper\">\n\t\t\n\t\t<a class=\"elementor-post__read-more\" href=\"https:\/\/4jmsolutions.com\/de\/ausruestung\/halbleiter-sensor-einzelne-komponenten\/pruefung-und-fertigstellung\/einbrennen\/wafer-level-power-device-burn-in-handler\/\" aria-label=\"Read more about Wafer-Level Power device Burn-in Handler\" tabindex=\"-1\" >\n\t\t\tRead More \u00bb\t\t<\/a>\n\n\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/article>\n\t\t\t\t<article class=\"elementor-post elementor-grid-item post-15720 page type-page status-publish has-post-thumbnail hentry industry-consumer-electronics industry-led maincategory-test-solutions-wafer-level-vcsel package-led package-micro-led package-vcsel process-features-easy-load-unloading-of-substrate-tiles process-features-modular-di-water-cooling-system-for-easy-maintenance process-features-programmable-temperature-profile process-features-test process-features-user-defined-burn-in-profile-continuous-or-pulse-mode-2\">\n\t\t\t\t<a class=\"elementor-post__thumbnail__link\" href=\"https:\/\/4jmsolutions.com\/de\/ausruestung\/halbleiter-sensor-einzelne-komponenten\/pruefung-und-fertigstellung\/einbrennen\/trooper-bi-wafer-level-vcsel-led-micro-led-burn-in-handler\/\" tabindex=\"-1\" >\n\t\t\t<div class=\"elementor-post__thumbnail\"><img loading=\"lazy\" decoding=\"async\" width=\"635\" height=\"463\" src=\"https:\/\/4jmsolutions.com\/wp-content\/uploads\/2022\/11\/trooperbi-waferlevel-vcselledmicro-led-burnin-test-system-thumbnail-1.png\" class=\"attachment-full size-full wp-image-13452\" alt=\"\" srcset=\"https:\/\/4jmsolutions.com\/wp-content\/uploads\/2022\/11\/trooperbi-waferlevel-vcselledmicro-led-burnin-test-system-thumbnail-1.png 635w, https:\/\/4jmsolutions.com\/wp-content\/uploads\/2022\/11\/trooperbi-waferlevel-vcselledmicro-led-burnin-test-system-thumbnail-1-300x219.png 300w\" sizes=\"(max-width: 635px) 100vw, 635px\" \/><\/div>\n\t\t<\/a>\n\t\t\t\t<div class=\"elementor-post__text\">\n\t\t\t\t<h3 class=\"elementor-post__title\">\n\t\t\t<a href=\"https:\/\/4jmsolutions.com\/de\/ausruestung\/halbleiter-sensor-einzelne-komponenten\/pruefung-und-fertigstellung\/einbrennen\/trooper-bi-wafer-level-vcsel-led-micro-led-burn-in-handler\/\" >\n\t\t\t\tTrooper-BI Wafer-Level VCSEL\/LED\/Micro LED Burn-in handler\t\t\t<\/a>\n\t\t<\/h3>\n\t\t\t\t<div class=\"elementor-post__excerpt\">\n\t\t\t<p>Trooper-BI Wafer-Level VCSEL\/LED\/Micro LED Burn-in Test System Dabei handelt es sich um eine schl\u00fcsselfertige L\u00f6sung f\u00fcr das Testen und Bumping von VCSEL-LED-Substraten auf Wafer-Ebene. Der<\/p>\n\t\t<\/div>\n\t\t\t\t\t<div class=\"elementor-post__read-more-wrapper\">\n\t\t\n\t\t<a class=\"elementor-post__read-more\" href=\"https:\/\/4jmsolutions.com\/de\/ausruestung\/halbleiter-sensor-einzelne-komponenten\/pruefung-und-fertigstellung\/einbrennen\/trooper-bi-wafer-level-vcsel-led-micro-led-burn-in-handler\/\" aria-label=\"Read more about Trooper-BI Wafer-Level VCSEL\/LED\/Micro LED Burn-in handler\" tabindex=\"-1\" >\n\t\t\tRead More \u00bb\t\t<\/a>\n\n\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/article>\n\t\t\t\t<\/div>\n\t\t\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t<section data-particle_enable=\"false\" data-particle-mobile-disabled=\"false\" class=\"elementor-section elementor-top-section elementor-element elementor-element-e65c277 elementor-section-boxed elementor-section-height-default elementor-section-height-default\" data-id=\"e65c277\" data-element_type=\"section\">\n\t\t\t\t\t\t<div class=\"elementor-container elementor-column-gap-default\">\n\t\t\t\t\t<div class=\"elementor-column elementor-col-100 elementor-top-column elementor-element elementor-element-7c1bcc6\" data-id=\"7c1bcc6\" data-element_type=\"column\">\n\t\t\t<div class=\"elementor-widget-wrap elementor-element-populated\">\n\t\t\t\t\t\t<div class=\"elementor-element elementor-element-e6a9c2f elementor-widget-divider--view-line_text elementor-widget-divider--element-align-center elementor-widget elementor-widget-divider\" data-id=\"e6a9c2f\" data-element_type=\"widget\" id=\"burn-in-sorters\" data-widget_type=\"divider.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t<div class=\"elementor-divider\">\n\t\t\t<span class=\"elementor-divider-separator\">\n\t\t\t\t\t\t\t<h3 class=\"elementor-divider__text elementor-divider__element\">\n\t\t\t\tBurn-In Sorter\t\t\t\t<\/h3>\n\t\t\t\t\t\t<\/span>\n\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t<section data-particle_enable=\"false\" data-particle-mobile-disabled=\"false\" class=\"elementor-section elementor-top-section elementor-element elementor-element-0bfa3a4 elementor-section-boxed elementor-section-height-default elementor-section-height-default\" data-id=\"0bfa3a4\" data-element_type=\"section\">\n\t\t\t\t\t\t<div class=\"elementor-container elementor-column-gap-default\">\n\t\t\t\t\t<div class=\"elementor-column elementor-col-100 elementor-top-column elementor-element elementor-element-07f03af\" data-id=\"07f03af\" data-element_type=\"column\">\n\t\t\t<div class=\"elementor-widget-wrap elementor-element-populated\">\n\t\t\t\t\t\t<div class=\"elementor-element elementor-element-513d52b elementor-widget-divider--view-line_text elementor-widget-divider--element-align-center elementor-widget elementor-widget-divider\" data-id=\"513d52b\" data-element_type=\"widget\" id=\"smt-burn-in-sorters\" data-widget_type=\"divider.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t<div class=\"elementor-divider\">\n\t\t\t<span class=\"elementor-divider-separator\">\n\t\t\t\t\t\t\t<h3 class=\"elementor-divider__text elementor-divider__element\">\n\t\t\t\tSMT Burn-In Sortierer\t\t\t\t<\/h3>\n\t\t\t\t\t\t<\/span>\n\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t<\/div>\n\t\t","protected":false},"excerpt":{"rendered":"<p>Burn-in Test In der Halbleiterfertigung sind Burn-In-Tests ein wichtiges Verfahren, um vorzeitige Ausf\u00e4lle von Bauelementen zu verhindern und sicherzustellen, dass nur die zuverl\u00e4ssigsten Produkte den Weg zum Endkunden finden. Im Wesentlichen geht es bei einem Burn-in-Test darum, ein Bauteil Bedingungen auszusetzen, die \u00fcber seine normalen Betriebsparameter hinausgehen, um m\u00f6gliche Ausf\u00e4lle zu beschleunigen. Dies kann durch [&hellip;]<\/p>\n","protected":false},"author":1,"featured_media":13468,"parent":14865,"menu_order":162,"comment_status":"closed","ping_status":"closed","template":"","meta":{"footnotes":""},"industry":[],"maincategory":[],"package":[],"process-features":[],"sub-category":[],"acf":[],"yoast_head":"<!-- This site is optimized with the Yoast SEO Premium plugin v20.5 (Yoast SEO v22.1) - https:\/\/yoast.com\/wordpress\/plugins\/seo\/ -->\n<title>Burn In-Testmaschinen - 4JMSolutions<\/title>\n<meta name=\"description\" content=\"We offers a wide rage of products for the Burn-In process, for Wafer Level VCSEL or Automotive Devices. Both Burn-In Chambers and BI Loaders.\" \/>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/4jmsolutions.com\/de\/ausruestung\/halbleiter-sensor-einzelne-komponenten\/pruefung-und-fertigstellung\/einbrennen\/\" \/>\n<meta property=\"og:locale\" content=\"de_DE\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Burn-In\" \/>\n<meta property=\"og:description\" content=\"We offers a wide rage of products for the Burn-In process, for Wafer Level VCSEL or Automotive Devices. 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