{"id":15732,"date":"2022-10-03T11:23:58","date_gmt":"2022-10-03T11:23:58","guid":{"rendered":"https:\/\/newsite.com\/ausruestung\/halbleiter-sensor-einzelne-komponenten\/test-und-abschluss\/einbrennen\/wafer-level-power-device-burn-in-handler\/"},"modified":"2024-02-28T18:08:24","modified_gmt":"2024-02-28T18:08:24","slug":"wafer-level-power-device-burn-in-handler","status":"publish","type":"page","link":"https:\/\/4jmsolutions.com\/de\/ausruestung\/halbleiter-sensor-einzelne-komponenten\/pruefung-und-fertigstellung\/einbrennen\/wafer-level-power-device-burn-in-handler\/","title":{"rendered":"Wafer-Level Power device Burn-in Handler"},"content":{"rendered":"\t\t<div data-elementor-type=\"wp-page\" data-elementor-id=\"15732\" class=\"elementor elementor-15732\" data-elementor-post-type=\"page\">\n\t\t\t\t\t\t<section data-particle_enable=\"false\" data-particle-mobile-disabled=\"false\" class=\"elementor-section elementor-top-section elementor-element elementor-element-2222cce5 elementor-section-stretched elementor-section-boxed elementor-section-height-default elementor-section-height-default\" data-id=\"2222cce5\" data-element_type=\"section\" data-settings=\"{&quot;stretch_section&quot;:&quot;section-stretched&quot;,&quot;animation&quot;:&quot;none&quot;}\">\n\t\t\t\t\t\t<div class=\"elementor-container elementor-column-gap-default\">\n\t\t\t\t\t<div class=\"elementor-column elementor-col-50 elementor-top-column elementor-element elementor-element-23027411\" data-id=\"23027411\" data-element_type=\"column\">\n\t\t\t<div class=\"elementor-widget-wrap elementor-element-populated\">\n\t\t\t\t\t\t<div class=\"elementor-element elementor-element-5e32de53 elementor-widget elementor-widget-heading\" data-id=\"5e32de53\" data-element_type=\"widget\" data-widget_type=\"heading.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t<style>\/*! elementor - v3.19.0 - 28-02-2024 *\/\n.elementor-heading-title{padding:0;margin:0;line-height:1}.elementor-widget-heading .elementor-heading-title[class*=elementor-size-]>a{color:inherit;font-size:inherit;line-height:inherit}.elementor-widget-heading .elementor-heading-title.elementor-size-small{font-size:15px}.elementor-widget-heading .elementor-heading-title.elementor-size-medium{font-size:19px}.elementor-widget-heading .elementor-heading-title.elementor-size-large{font-size:29px}.elementor-widget-heading .elementor-heading-title.elementor-size-xl{font-size:39px}.elementor-widget-heading .elementor-heading-title.elementor-size-xxl{font-size:59px}<\/style><h5 class=\"elementor-heading-title elementor-size-default\">Wafer-Level Power device Burn-in Handler<\/h5>\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-7102aed3 elementor-widget elementor-widget-text-editor\" data-id=\"7102aed3\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t<style>\/*! elementor - v3.19.0 - 28-02-2024 *\/\n.elementor-widget-text-editor.elementor-drop-cap-view-stacked .elementor-drop-cap{background-color:#69727d;color:#fff}.elementor-widget-text-editor.elementor-drop-cap-view-framed .elementor-drop-cap{color:#69727d;border:3px solid;background-color:transparent}.elementor-widget-text-editor:not(.elementor-drop-cap-view-default) .elementor-drop-cap{margin-top:8px}.elementor-widget-text-editor:not(.elementor-drop-cap-view-default) .elementor-drop-cap-letter{width:1em;height:1em}.elementor-widget-text-editor .elementor-drop-cap{float:left;text-align:center;line-height:1;font-size:50px}.elementor-widget-text-editor .elementor-drop-cap-letter{display:inline-block}<\/style>\t\t\t\t<p class=\"mbr-text mbr-fonts-style mb-4 display-7\">Bei diesem System handelt es sich um das neueste, f\u00fcr Leistungsbauelemente entwickelte Burn-In-Testsystem auf Wafer-Ebene. Dieser innovative Tester bietet die M\u00f6glichkeit, 2 Wassertests parallel durchzuf\u00fchren und 480 Die-Tests parallel pro Wafer durchzuf\u00fchren. Unabh\u00e4ngige Treiberkan\u00e4le f\u00fcr gleichzeitige Spannungs- und Strommessung sowie Temperatur\u00fcberwachung. Zur Aufnahme von Inertgasen wie Stickstoff und Lichtbogenunterdr\u00fcckungsgasen ist er mit einer Dichtkammer ausgestattet. Sie sch\u00fctzt die Pr\u00fcflinge vor Lichtbogen und Oxidation und sorgt daf\u00fcr, dass der Tester in einem betriebsbereiten Temperaturzustand bleibt, ohne zu \u00fcberhitzen.<\/p><div class=\"mbr-text mbr-fonts-style counter-container display-7\"><ul><li class=\"\">Integration in vollautomatische Handlingsysteme<\/li><li class=\"\">Komplettl\u00f6sung mit integrierten Pr\u00fcfkammern<\/li><li class=\"\">Hochgradig anpassbares Einbrennprofil (kontinuierlich oder gepulst)<\/li><li class=\"\">Integriert mit Stickstoffgas-K\u00fchlsystem<\/li><li class=\"\">Einfaches Be- und Entladen der Substratplatten<\/li><li class=\"\">Programmierbares Temperaturprofil<\/li><li class=\"\">Eingang\/Ausgang: Wafer<\/li><li class=\"\">UPH bis zu 720 Einheiten<\/li><li class=\"\">Einbrennzeit programmierbar<\/li><li class=\"\">Drainspannung: bis zu 3.000V DC<\/li><li class=\"\">Test Parameters Vth, IGSS, IDSS, VDSon<\/li><li class=\"\">Genauigkeit der Leckstrommessung: 1%.<\/li><li class=\"\">Aufw\u00e4rmzeit: 15 Minuten (von Raumtemperatur auf 150\u00b0C)<\/li><li class=\"\">Temperaturtoleranz: +5\u00b0C<\/li><\/ul><\/div>\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-7ddb80ec elementor-align-left elementor-tablet-align-center elementor-mobile-align-center elementor-invisible elementor-widget elementor-widget-button\" data-id=\"7ddb80ec\" data-element_type=\"widget\" data-settings=\"{&quot;_animation&quot;:&quot;slideInUp&quot;}\" data-widget_type=\"button.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t<div class=\"elementor-button-wrapper\">\n\t\t\t<a class=\"elementor-button elementor-button-link elementor-size-md\" href=\"https:\/\/4jmsolutions.com\/contact\/\" id=\"15732\">\n\t\t\t\t\t\t<span class=\"elementor-button-content-wrapper\">\n\t\t\t\t\t\t<span class=\"elementor-button-text\">Weitere Informationen 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class=\"elementor-divider__text elementor-divider__element\">\n\t\t\t\tVerwandte Burn-In Systeme\t\t\t\t<\/h3>\n\t\t\t\t\t\t<\/span>\n\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-5b96b91c elementor-posts--thumbnail-none elementor-grid-3 elementor-grid-tablet-2 elementor-grid-mobile-1 elementor-card-shadow-yes elementor-posts__hover-gradient elementor-widget elementor-widget-posts\" data-id=\"5b96b91c\" data-element_type=\"widget\" data-settings=\"{&quot;cards_columns&quot;:&quot;3&quot;,&quot;cards_columns_tablet&quot;:&quot;2&quot;,&quot;cards_columns_mobile&quot;:&quot;1&quot;,&quot;cards_row_gap&quot;:{&quot;unit&quot;:&quot;px&quot;,&quot;size&quot;:35,&quot;sizes&quot;:[]},&quot;cards_row_gap_tablet&quot;:{&quot;unit&quot;:&quot;px&quot;,&quot;size&quot;:&quot;&quot;,&quot;sizes&quot;:[]},&quot;cards_row_gap_mobile&quot;:{&quot;unit&quot;:&quot;px&quot;,&quot;size&quot;:&quot;&quot;,&quot;sizes&quot;:[]}}\" 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das neueste, auf dem Markt erh\u00e4ltliche Burn-In-Testsystem auf Modulebene f\u00fcr Leistungsger\u00e4te. Seine innovative<\/p>\n\t\t<\/div>\n\t\t\t\t\t<div class=\"elementor-post__read-more-wrapper\">\n\t\t\n\t\t<a class=\"elementor-post__read-more\" href=\"https:\/\/4jmsolutions.com\/de\/ausruestung\/halbleiter-sensor-einzelne-komponenten\/pruefung-und-fertigstellung\/einbrennen\/module-level-power-device-burn-in-handler\/\" aria-label=\"Read more about Module-Level Power Device Burn-in Handler\" tabindex=\"-1\" >\n\t\t\tRead More \u00bb\t\t<\/a>\n\n\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/article>\n\t\t\t\t<article class=\"elementor-post elementor-grid-item post-15720 page type-page status-publish has-post-thumbnail hentry industry-consumer-electronics industry-led maincategory-test-solutions-wafer-level-vcsel package-led package-micro-led package-vcsel process-features-easy-load-unloading-of-substrate-tiles process-features-modular-di-water-cooling-system-for-easy-maintenance process-features-programmable-temperature-profile process-features-test process-features-user-defined-burn-in-profile-continuous-or-pulse-mode-2\">\n\t\t\t<div class=\"elementor-post__card\">\n\t\t\t\t<div class=\"elementor-post__text\">\n\t\t\t\t<h3 class=\"elementor-post__title\">\n\t\t\t<a href=\"https:\/\/4jmsolutions.com\/de\/ausruestung\/halbleiter-sensor-einzelne-komponenten\/pruefung-und-fertigstellung\/einbrennen\/trooper-bi-wafer-level-vcsel-led-micro-led-burn-in-handler\/\" >\n\t\t\t\tTrooper-BI Wafer-Level VCSEL\/LED\/Micro LED Burn-in handler\t\t\t<\/a>\n\t\t<\/h3>\n\t\t\t\t<div class=\"elementor-post__excerpt\">\n\t\t\t<p>Trooper-BI Wafer-Level VCSEL\/LED\/Micro LED Burn-in Test System Dabei handelt es sich um eine schl\u00fcsselfertige L\u00f6sung f\u00fcr das Testen und Bumping von VCSEL-LED-Substraten auf Wafer-Ebene. Der<\/p>\n\t\t<\/div>\n\t\t\t\t\t<div class=\"elementor-post__read-more-wrapper\">\n\t\t\n\t\t<a class=\"elementor-post__read-more\" href=\"https:\/\/4jmsolutions.com\/de\/ausruestung\/halbleiter-sensor-einzelne-komponenten\/pruefung-und-fertigstellung\/einbrennen\/trooper-bi-wafer-level-vcsel-led-micro-led-burn-in-handler\/\" aria-label=\"Read more about Trooper-BI Wafer-Level VCSEL\/LED\/Micro LED Burn-in handler\" tabindex=\"-1\" >\n\t\t\tRead More \u00bb\t\t<\/a>\n\n\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/article>\n\t\t\t\t<\/div>\n\t\t\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t<\/div>\n\t\t","protected":false},"excerpt":{"rendered":"<p>Wafer-Level Power device Burn-in Handler Bei diesem System handelt es sich um das neueste, f\u00fcr Leistungsbauelemente entwickelte Burn-In-Testsystem auf Wafer-Ebene. Dieser innovative Tester bietet die M\u00f6glichkeit, 2 Wassertests parallel durchzuf\u00fchren und 480 Die-Tests parallel pro Wafer durchzuf\u00fchren. Unabh\u00e4ngige Treiberkan\u00e4le f\u00fcr gleichzeitige Spannungs- und Strommessung sowie Temperatur\u00fcberwachung. Zur Aufnahme von Inertgasen wie Stickstoff und Lichtbogenunterdr\u00fcckungsgasen ist [&hellip;]<\/p>\n","protected":false},"author":3,"featured_media":13454,"parent":14962,"menu_order":244,"comment_status":"closed","ping_status":"closed","template":"","meta":{"footnotes":""},"industry":[],"maincategory":[],"package":[],"process-features":[],"sub-category":[],"acf":[],"yoast_head":"<!-- This site is optimized with the Yoast SEO Premium plugin v20.5 (Yoast SEO v22.1) - https:\/\/yoast.com\/wordpress\/plugins\/seo\/ -->\n<title>Wafer-Level Power device Burn-in Handler - 4JMSolutions<\/title>\n<meta name=\"description\" content=\"It is the latest wafer-level burn in test system designed for power devices. 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