{"id":14867,"date":"2022-09-25T08:35:49","date_gmt":"2022-09-25T08:35:49","guid":{"rendered":"https:\/\/newsite.com\/tests-et-finitions\/burn-in\/"},"modified":"2024-01-25T15:14:32","modified_gmt":"2024-01-25T15:14:32","slug":"deverminage","status":"publish","type":"page","link":"https:\/\/4jmsolutions.com\/fr\/equipement\/semiconducteur-detection-composants-discrets\/tests-et-finitions\/deverminage\/","title":{"rendered":"Test de d\u00e9verminage ou Burn-in test"},"content":{"rendered":"\t\t<div data-elementor-type=\"wp-page\" data-elementor-id=\"14867\" class=\"elementor elementor-14867\" data-elementor-post-type=\"page\">\n\t\t\t\t\t\t<section data-particle_enable=\"false\" data-particle-mobile-disabled=\"false\" class=\"elementor-section elementor-top-section elementor-element elementor-element-3fa6ed37 elementor-section-stretched elementor-section-boxed elementor-section-height-default elementor-section-height-default\" data-id=\"3fa6ed37\" data-element_type=\"section\" data-settings=\"{&quot;stretch_section&quot;:&quot;section-stretched&quot;,&quot;animation&quot;:&quot;none&quot;}\">\n\t\t\t\t\t\t<div class=\"elementor-container elementor-column-gap-default\">\n\t\t\t\t\t<div class=\"elementor-column elementor-col-50 elementor-top-column elementor-element elementor-element-3c02071f\" data-id=\"3c02071f\" data-element_type=\"column\">\n\t\t\t<div class=\"elementor-widget-wrap elementor-element-populated\">\n\t\t\t\t\t\t<div class=\"elementor-element elementor-element-3358cf1c elementor-widget elementor-widget-text-editor\" data-id=\"3358cf1c\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t<style>\/*! elementor - v3.19.0 - 28-02-2024 *\/\n.elementor-widget-text-editor.elementor-drop-cap-view-stacked .elementor-drop-cap{background-color:#69727d;color:#fff}.elementor-widget-text-editor.elementor-drop-cap-view-framed .elementor-drop-cap{color:#69727d;border:3px solid;background-color:transparent}.elementor-widget-text-editor:not(.elementor-drop-cap-view-default) .elementor-drop-cap{margin-top:8px}.elementor-widget-text-editor:not(.elementor-drop-cap-view-default) .elementor-drop-cap-letter{width:1em;height:1em}.elementor-widget-text-editor .elementor-drop-cap{float:left;text-align:center;line-height:1;font-size:50px}.elementor-widget-text-editor .elementor-drop-cap-letter{display:inline-block}<\/style>\t\t\t\t<h5><span style=\"font-weight: 400;\">Test de d\u00e9verminage<\/span><\/h5><p>Dans le secteur de la fabrication des semi-conducteurs, le burn-in test est une proc\u00e9dure essentielle con\u00e7ue pour pr\u00e9cipiter les d\u00e9faillances pr\u00e9coces des composants et garantir que seuls les produits les plus fiables parviennent jusqu&rsquo;\u00e0 l&rsquo;utilisateur final. \u00c0 la base, un bur-in test (test de d\u00e9verminage) consiste \u00e0 soumettre un dispositif \u00e0 des conditions d\u00e9passant ses param\u00e8tres op\u00e9rationnels habituels afin d&rsquo;acc\u00e9l\u00e9rer toute d\u00e9faillance potentielle. Celles-ci peuvent \u00eatre dues \u00e0 des d\u00e9fauts de fabrication ou \u00e0 d&rsquo;autres anomalies. L&rsquo;objectif est simple : identifier et \u00e9liminer les dispositifs d\u00e9fectueux, afin de garantir leur long\u00e9vit\u00e9 et leur fiabilit\u00e9.<\/p><p>L&rsquo;une des machines les plus remarquables de <span style=\"font-weight: 400;\"><img decoding=\"async\" class=\"alignnone wp-image-12859\" src=\"https:\/\/4jmsolutions.com\/wp-content\/uploads\/2022\/10\/logo-carets-300x158.png\" alt=\"\" width=\"22\" height=\"12\" srcset=\"https:\/\/4jmsolutions.com\/wp-content\/uploads\/2022\/10\/logo-carets-300x158.png 300w, https:\/\/4jmsolutions.com\/wp-content\/uploads\/2022\/10\/logo-carets.png 512w\" sizes=\"(max-width: 22px) 100vw, 22px\" \/><\/span>4JMSolutions, con\u00e7ue pour ce test critique, est la machine de bur-in test e Trooper-BI wafer level (VCSEL\/LED\/Micro LED). Cette solution pr\u00eate \u00e0 l&#8217;emploi permet de sonder et de r\u00e9aliser des tests de Burn-in sur des substrats LED VCSEL au niveau de wafer . Capable de tester simultan\u00e9ment jusqu&rsquo;\u00e0 7 200 dispositifs sous test (DUT) \u00e0 une temp\u00e9rature contr\u00f4l\u00e9e pouvant atteindre 135\u00b0C, elle se distingue par sa pr\u00e9cision et son \u00e9volutivit\u00e9. Ces tests \u00e0 grande \u00e9chelle s&rsquo;appuient sur un syst\u00e8me int\u00e9gr\u00e9 de refroidissement par eau, de d\u00e9tection des fuites et un syst\u00e8me vigilant de surveillance de la temp\u00e9rature, qui garantissent la s\u00e9curit\u00e9 et l&rsquo;int\u00e9grit\u00e9 du processus.<\/p><p>En ce qui concerne les devices de puissance, la Machine de burn-in test des devices de puissance au niveau de wafer offre des solutions innovantes. Avec son parall\u00e9lisme de test sur deux wafers , elle peut tester simultan\u00e9ment 480 puces par wafer . Elle abrite des canaux de pilotage ind\u00e9pendants, permettant des mesures simultan\u00e9es de tension\/courant et la surveillance de la temp\u00e9rature. Sa conception de pointe comprend une chambre scell\u00e9e qui accueille des gaz inertes tels que l&rsquo;azote, garantissant que les objets test\u00e9s sont prot\u00e9g\u00e9s de l&rsquo;arc \u00e9lectrique et de l&rsquo;oxydation. Cette caract\u00e9ristique innovante garantit que l&rsquo;appareil reste \u00e0 une temp\u00e9rature op\u00e9rationnelle optimale, \u00e9liminant ainsi les risques de surchauffe.<\/p><p>Les machines de burn-in trieuses , telles que les JTS-8700, JTS-30000, JTS-8500 et Eagle S8800, rationalisent le processus de tri apr\u00e8s le test de burn-in . Ces machines ne sont pas seulement destin\u00e9es aux tests, mais aussi \u00e0 la pr\u00e9cision dans la manipulation, le chargement et le d\u00e9chargement des circuits int\u00e9gr\u00e9s. Avec une gamme de compatibilit\u00e9 &#8211; de BGA et CSP \u00e0 QFP et QFN &#8211; elles garantissent des capacit\u00e9s de tri efficaces. Ces machines renforcent encore leur fiabilit\u00e9 gr\u00e2ce \u00e0 leurs menus MMI faciles \u00e0 parcourir, qui garantissent une utilisation et une maintenance conviviales.<\/p>\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t<div class=\"elementor-column elementor-col-50 elementor-top-column elementor-element elementor-element-49db607f\" data-id=\"49db607f\" data-element_type=\"column\">\n\t\t\t<div class=\"elementor-widget-wrap elementor-element-populated\">\n\t\t\t\t\t\t<div class=\"elementor-element elementor-element-52103216 elementor-widget elementor-widget-image-gallery\" data-id=\"52103216\" data-element_type=\"widget\" data-widget_type=\"image-gallery.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t<style>\/*! elementor - v3.19.0 - 28-02-2024 *\/\n.elementor-image-gallery .gallery-item{display:inline-block;text-align:center;vertical-align:top;width:100%;max-width:100%;margin:0 auto}.elementor-image-gallery .gallery-item 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\/>\n\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t<section data-particle_enable=\"false\" data-particle-mobile-disabled=\"false\" class=\"elementor-section elementor-top-section elementor-element elementor-element-18afb812 elementor-section-boxed elementor-section-height-default elementor-section-height-default\" data-id=\"18afb812\" data-element_type=\"section\" data-settings=\"{&quot;animation_tablet&quot;:&quot;none&quot;}\">\n\t\t\t\t\t\t<div class=\"elementor-container elementor-column-gap-default\">\n\t\t\t\t\t<div class=\"elementor-column elementor-col-100 elementor-top-column elementor-element elementor-element-1cde14af\" data-id=\"1cde14af\" data-element_type=\"column\">\n\t\t\t<div class=\"elementor-widget-wrap elementor-element-populated\">\n\t\t\t\t\t\t<div class=\"elementor-element elementor-element-613c0508 elementor-align-left elementor-tablet-align-center 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class=\"elementor-post elementor-grid-item post-15742 page type-page status-publish has-post-thumbnail hentry\">\n\t\t\t\t<a class=\"elementor-post__thumbnail__link\" href=\"https:\/\/4jmsolutions.com\/fr\/equipement\/semiconducteur-detection-composants-discrets\/tests-et-finitions\/deverminage\/handler-de-burn-in-pour-dispositifs-de-puissance-au-niveau-du-wafer-2\/\" tabindex=\"-1\" >\n\t\t\t<div class=\"elementor-post__thumbnail\"><img decoding=\"async\" width=\"635\" height=\"463\" src=\"https:\/\/4jmsolutions.com\/wp-content\/uploads\/2022\/11\/module-level-power-device-burn-in-test-handler-thumbnail.png\" class=\"attachment-full size-full wp-image-13455\" alt=\"\" srcset=\"https:\/\/4jmsolutions.com\/wp-content\/uploads\/2022\/11\/module-level-power-device-burn-in-test-handler-thumbnail.png 635w, https:\/\/4jmsolutions.com\/wp-content\/uploads\/2022\/11\/module-level-power-device-burn-in-test-handler-thumbnail-300x219.png 300w\" sizes=\"(max-width: 635px) 100vw, 635px\" \/><\/div>\n\t\t<\/a>\n\t\t\t\t<div class=\"elementor-post__text\">\n\t\t\t\t<h3 class=\"elementor-post__title\">\n\t\t\t<a href=\"https:\/\/4jmsolutions.com\/fr\/equipement\/semiconducteur-detection-composants-discrets\/tests-et-finitions\/deverminage\/handler-de-burn-in-pour-dispositifs-de-puissance-au-niveau-du-wafer-2\/\" >\n\t\t\t\tHandler de Burn-in pour Dispositifs de puissance au niveau du Wafer\t\t\t<\/a>\n\t\t<\/h3>\n\t\t\t\t<div class=\"elementor-post__excerpt\">\n\t\t\t<p>Handler de Burn-in pour Dispositifs de Puissance au Niveau du Wafer Il s&rsquo;agit du dernier syst\u00e8me de test de Burn-in au niveau du wafer con\u00e7u<\/p>\n\t\t<\/div>\n\t\t\t\t\t<div class=\"elementor-post__read-more-wrapper\">\n\t\t\n\t\t<a class=\"elementor-post__read-more\" href=\"https:\/\/4jmsolutions.com\/fr\/equipement\/semiconducteur-detection-composants-discrets\/tests-et-finitions\/deverminage\/handler-de-burn-in-pour-dispositifs-de-puissance-au-niveau-du-wafer-2\/\" aria-label=\"Read more about Handler de Burn-in pour Dispositifs de puissance au niveau du Wafer\" tabindex=\"-1\" >\n\t\t\tRead More \u00bb\t\t<\/a>\n\n\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/article>\n\t\t\t\t<article class=\"elementor-post elementor-grid-item post-15731 page type-page status-publish has-post-thumbnail hentry\">\n\t\t\t\t<a class=\"elementor-post__thumbnail__link\" href=\"https:\/\/4jmsolutions.com\/fr\/equipement\/semiconducteur-detection-composants-discrets\/tests-et-finitions\/deverminage\/handler-de-burn-in-pour-dispositifs-de-puissance-au-niveau-du-wafer\/\" tabindex=\"-1\" >\n\t\t\t<div class=\"elementor-post__thumbnail\"><img loading=\"lazy\" decoding=\"async\" width=\"635\" height=\"463\" src=\"https:\/\/4jmsolutions.com\/wp-content\/uploads\/2022\/11\/wafer-level-power-device-burn-in-test-handler-thumbnail.png\" class=\"attachment-full size-full wp-image-13453\" alt=\"\" srcset=\"https:\/\/4jmsolutions.com\/wp-content\/uploads\/2022\/11\/wafer-level-power-device-burn-in-test-handler-thumbnail.png 635w, https:\/\/4jmsolutions.com\/wp-content\/uploads\/2022\/11\/wafer-level-power-device-burn-in-test-handler-thumbnail-300x219.png 300w\" sizes=\"(max-width: 635px) 100vw, 635px\" \/><\/div>\n\t\t<\/a>\n\t\t\t\t<div class=\"elementor-post__text\">\n\t\t\t\t<h3 class=\"elementor-post__title\">\n\t\t\t<a href=\"https:\/\/4jmsolutions.com\/fr\/equipement\/semiconducteur-detection-composants-discrets\/tests-et-finitions\/deverminage\/handler-de-burn-in-pour-dispositifs-de-puissance-au-niveau-du-wafer\/\" >\n\t\t\t\tHandler de Burn-in pour Dispositifs de puissance au niveau du Wafer\t\t\t<\/a>\n\t\t<\/h3>\n\t\t\t\t<div class=\"elementor-post__excerpt\">\n\t\t\t<p>Handler de Burn-in pour Dispositifs de Puissance au Niveau du Wafer Il s&rsquo;agit du dernier syst\u00e8me de test de Burn-in au niveau du wafer con\u00e7u<\/p>\n\t\t<\/div>\n\t\t\t\t\t<div class=\"elementor-post__read-more-wrapper\">\n\t\t\n\t\t<a class=\"elementor-post__read-more\" href=\"https:\/\/4jmsolutions.com\/fr\/equipement\/semiconducteur-detection-composants-discrets\/tests-et-finitions\/deverminage\/handler-de-burn-in-pour-dispositifs-de-puissance-au-niveau-du-wafer\/\" aria-label=\"Read more about Handler de Burn-in pour Dispositifs de puissance au niveau du Wafer\" tabindex=\"-1\" >\n\t\t\tRead More \u00bb\t\t<\/a>\n\n\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/article>\n\t\t\t\t<article class=\"elementor-post elementor-grid-item post-15719 page type-page status-publish has-post-thumbnail hentry industry-consumer-electronics industry-led maincategory-test-solutions-wafer-level-vcsel package-led package-micro-led package-vcsel process-features-easy-load-unloading-of-substrate-tiles process-features-modular-di-water-cooling-system-for-easy-maintenance process-features-programmable-temperature-profile process-features-test process-features-user-defined-burn-in-profile-continuous-or-pulse-mode-2\">\n\t\t\t\t<a class=\"elementor-post__thumbnail__link\" href=\"https:\/\/4jmsolutions.com\/fr\/equipement\/semiconducteur-detection-composants-discrets\/tests-et-finitions\/deverminage\/trooper-bi-handler-de-burn-in-pour-vcsel-led-micro-led-au-niveau-du-wafer\/\" tabindex=\"-1\" >\n\t\t\t<div class=\"elementor-post__thumbnail\"><img loading=\"lazy\" decoding=\"async\" width=\"635\" height=\"463\" src=\"https:\/\/4jmsolutions.com\/wp-content\/uploads\/2022\/11\/trooperbi-waferlevel-vcselledmicro-led-burnin-test-system-thumbnail-1.png\" class=\"attachment-full size-full wp-image-13451\" alt=\"\" srcset=\"https:\/\/4jmsolutions.com\/wp-content\/uploads\/2022\/11\/trooperbi-waferlevel-vcselledmicro-led-burnin-test-system-thumbnail-1.png 635w, https:\/\/4jmsolutions.com\/wp-content\/uploads\/2022\/11\/trooperbi-waferlevel-vcselledmicro-led-burnin-test-system-thumbnail-1-300x219.png 300w\" sizes=\"(max-width: 635px) 100vw, 635px\" \/><\/div>\n\t\t<\/a>\n\t\t\t\t<div class=\"elementor-post__text\">\n\t\t\t\t<h3 class=\"elementor-post__title\">\n\t\t\t<a href=\"https:\/\/4jmsolutions.com\/fr\/equipement\/semiconducteur-detection-composants-discrets\/tests-et-finitions\/deverminage\/trooper-bi-handler-de-burn-in-pour-vcsel-led-micro-led-au-niveau-du-wafer\/\" >\n\t\t\t\tTrooper-BI Handler de Burn-in pour VCSEL\/LED\/Micro LED au Niveau du Wafer\t\t\t<\/a>\n\t\t<\/h3>\n\t\t\t\t<div class=\"elementor-post__excerpt\">\n\t\t\t<p>Trooper-BI Syst\u00e8me de test de Burn-in au Niveau du Wafer pour VCSEL\/LED\/Micro LED Il s&rsquo;agit d&rsquo;une solution cl\u00e9 en main pour sonder et soumettre au<\/p>\n\t\t<\/div>\n\t\t\t\t\t<div class=\"elementor-post__read-more-wrapper\">\n\t\t\n\t\t<a class=\"elementor-post__read-more\" href=\"https:\/\/4jmsolutions.com\/fr\/equipement\/semiconducteur-detection-composants-discrets\/tests-et-finitions\/deverminage\/trooper-bi-handler-de-burn-in-pour-vcsel-led-micro-led-au-niveau-du-wafer\/\" aria-label=\"Read more about Trooper-BI Handler de Burn-in pour VCSEL\/LED\/Micro LED au Niveau du Wafer\" tabindex=\"-1\" >\n\t\t\tRead More \u00bb\t\t<\/a>\n\n\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/article>\n\t\t\t\t<\/div>\n\t\t\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t<section data-particle_enable=\"false\" data-particle-mobile-disabled=\"false\" class=\"elementor-section elementor-top-section elementor-element elementor-element-e65c277 elementor-section-boxed elementor-section-height-default elementor-section-height-default\" data-id=\"e65c277\" data-element_type=\"section\">\n\t\t\t\t\t\t<div class=\"elementor-container elementor-column-gap-default\">\n\t\t\t\t\t<div class=\"elementor-column elementor-col-100 elementor-top-column elementor-element elementor-element-7c1bcc6\" data-id=\"7c1bcc6\" data-element_type=\"column\">\n\t\t\t<div class=\"elementor-widget-wrap elementor-element-populated\">\n\t\t\t\t\t\t<div class=\"elementor-element elementor-element-e6a9c2f elementor-widget-divider--view-line_text elementor-widget-divider--element-align-center elementor-widget elementor-widget-divider\" data-id=\"e6a9c2f\" data-element_type=\"widget\" id=\"burn-in-sorters\" data-widget_type=\"divider.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t<div class=\"elementor-divider\">\n\t\t\t<span class=\"elementor-divider-separator\">\n\t\t\t\t\t\t\t<h3 class=\"elementor-divider__text elementor-divider__element\">\n\t\t\t\ttrieurs de d\u00e9verminage\t\t\t\t<\/h3>\n\t\t\t\t\t\t<\/span>\n\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t<section data-particle_enable=\"false\" data-particle-mobile-disabled=\"false\" class=\"elementor-section elementor-top-section elementor-element elementor-element-0bfa3a4 elementor-section-boxed elementor-section-height-default elementor-section-height-default\" data-id=\"0bfa3a4\" data-element_type=\"section\">\n\t\t\t\t\t\t<div class=\"elementor-container elementor-column-gap-default\">\n\t\t\t\t\t<div class=\"elementor-column elementor-col-100 elementor-top-column elementor-element elementor-element-07f03af\" data-id=\"07f03af\" data-element_type=\"column\">\n\t\t\t<div class=\"elementor-widget-wrap elementor-element-populated\">\n\t\t\t\t\t\t<div class=\"elementor-element elementor-element-513d52b elementor-widget-divider--view-line_text elementor-widget-divider--element-align-center elementor-widget elementor-widget-divider\" data-id=\"513d52b\" data-element_type=\"widget\" id=\"smt-burn-in-sorters\" data-widget_type=\"divider.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t<div class=\"elementor-divider\">\n\t\t\t<span class=\"elementor-divider-separator\">\n\t\t\t\t\t\t\t<h3 class=\"elementor-divider__text elementor-divider__element\">\n\t\t\t\tTrieurs de d\u00e9verminage SMT\t\t\t\t<\/h3>\n\t\t\t\t\t\t<\/span>\n\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t<\/div>\n\t\t","protected":false},"excerpt":{"rendered":"<p>Test de d\u00e9verminage Dans le secteur de la fabrication des semi-conducteurs, le burn-in test est une proc\u00e9dure essentielle con\u00e7ue pour pr\u00e9cipiter les d\u00e9faillances pr\u00e9coces des composants et garantir que seuls les produits les plus fiables parviennent jusqu&rsquo;\u00e0 l&rsquo;utilisateur final. \u00c0 la base, un bur-in test (test de d\u00e9verminage) consiste \u00e0 soumettre un dispositif \u00e0 des [&hellip;]<\/p>\n","protected":false},"author":1,"featured_media":13467,"parent":14860,"menu_order":162,"comment_status":"closed","ping_status":"closed","template":"","meta":{"footnotes":""},"industry":[],"maincategory":[],"package":[],"process-features":[],"sub-category":[],"acf":[],"yoast_head":"<!-- This site is optimized with the Yoast SEO Premium plugin v20.5 (Yoast SEO v22.1) - https:\/\/yoast.com\/wordpress\/plugins\/seo\/ -->\n<title>Burn-In - 4JMSolutions<\/title>\n<meta name=\"description\" content=\"Machines de test de d\u00e9verminage ou Burn-in test - 4JMSolutions\" \/>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/4jmsolutions.com\/fr\/equipement\/semiconducteur-detection-composants-discrets\/tests-et-finitions\/deverminage\/\" \/>\n<meta property=\"og:locale\" content=\"fr_FR\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" 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