{"id":14900,"date":"2022-09-25T08:36:40","date_gmt":"2022-09-25T08:36:40","guid":{"rendered":"https:\/\/newsite.com\/tests-et-finitions\/aoi\/"},"modified":"2024-01-24T10:38:54","modified_gmt":"2024-01-24T10:38:54","slug":"ioa","status":"publish","type":"page","link":"https:\/\/4jmsolutions.com\/fr\/equipement\/semiconducteur-detection-composants-discrets\/tests-et-finitions\/ioa\/","title":{"rendered":"AOI pour semi-conducteurs"},"content":{"rendered":"\t\t<div data-elementor-type=\"wp-page\" data-elementor-id=\"14900\" class=\"elementor elementor-14900\" data-elementor-post-type=\"page\">\n\t\t\t\t\t\t<section data-particle_enable=\"false\" data-particle-mobile-disabled=\"false\" class=\"elementor-section elementor-top-section elementor-element elementor-element-e2797cf elementor-section-stretched elementor-section-boxed elementor-section-height-default elementor-section-height-default\" data-id=\"e2797cf\" data-element_type=\"section\" data-settings=\"{&quot;stretch_section&quot;:&quot;section-stretched&quot;,&quot;animation&quot;:&quot;none&quot;}\">\n\t\t\t\t\t\t<div class=\"elementor-container elementor-column-gap-default\">\n\t\t\t\t\t<div class=\"elementor-column elementor-col-50 elementor-top-column elementor-element elementor-element-117211ec\" data-id=\"117211ec\" data-element_type=\"column\">\n\t\t\t<div class=\"elementor-widget-wrap elementor-element-populated\">\n\t\t\t\t\t\t<div class=\"elementor-element elementor-element-4b1f0fd6 elementor-widget elementor-widget-text-editor\" data-id=\"4b1f0fd6\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t<style>\/*! elementor - v3.19.0 - 28-02-2024 *\/\n.elementor-widget-text-editor.elementor-drop-cap-view-stacked .elementor-drop-cap{background-color:#69727d;color:#fff}.elementor-widget-text-editor.elementor-drop-cap-view-framed .elementor-drop-cap{color:#69727d;border:3px solid;background-color:transparent}.elementor-widget-text-editor:not(.elementor-drop-cap-view-default) .elementor-drop-cap{margin-top:8px}.elementor-widget-text-editor:not(.elementor-drop-cap-view-default) .elementor-drop-cap-letter{width:1em;height:1em}.elementor-widget-text-editor .elementor-drop-cap{float:left;text-align:center;line-height:1;font-size:50px}.elementor-widget-text-editor .elementor-drop-cap-letter{display:inline-block}<\/style>\t\t\t\t<h5><span style=\"font-weight: 400;\">Machines AOI pour Wafers , Dies et semi-conducteurs encapsul\u00e9s<\/span><\/h5><p><span style=\"font-weight: 400;\"><img decoding=\"async\" class=\"alignnone wp-image-701\" src=\"https:\/\/4jmsolutions.com\/wp-content\/uploads\/2022\/09\/cropped-favicon-300x300.png\" alt=\"\" width=\"21\" height=\"21\" srcset=\"https:\/\/4jmsolutions.com\/wp-content\/uploads\/2022\/09\/cropped-favicon-300x300.png 300w, https:\/\/4jmsolutions.com\/wp-content\/uploads\/2022\/09\/cropped-favicon-150x150.png 150w, https:\/\/4jmsolutions.com\/wp-content\/uploads\/2022\/09\/cropped-favicon-50x50.png 50w, https:\/\/4jmsolutions.com\/wp-content\/uploads\/2022\/09\/cropped-favicon-100x100.png 100w, https:\/\/4jmsolutions.com\/wp-content\/uploads\/2022\/09\/cropped-favicon.png 512w, https:\/\/4jmsolutions.com\/wp-content\/uploads\/2022\/09\/cropped-favicon-270x270.png 270w, https:\/\/4jmsolutions.com\/wp-content\/uploads\/2022\/09\/cropped-favicon-192x192.png 192w, https:\/\/4jmsolutions.com\/wp-content\/uploads\/2022\/09\/cropped-favicon-180x180.png 180w, https:\/\/4jmsolutions.com\/wp-content\/uploads\/2022\/09\/cropped-favicon-32x32.png 32w\" sizes=\"(max-width: 21px) 100vw, 21px\" \/>4JMSolutions est en train de transformer ce secteur en proposant une gamme de machines d&rsquo;inspection optique automatis\u00e9es et sophistiqu\u00e9es, sp\u00e9cialement con\u00e7ues pour les wafers , les Dies et les semi-conducteurs encapsul\u00e9s. Voici quelques-unes de nos machines AOI:<\/span><\/p><p>La machine Eagle V8500, syst\u00e8me d&rsquo;inspection par vision 3,5D, qui illustre la technologie de pointe cor\u00e9enne, \u00e9tant la premi\u00e8re \u00e0 introduire la m\u00e9thode du faisceau fendu pour l&rsquo;inspection PKG. Ce syst\u00e8me ne se contente pas d&rsquo;inspecter les d\u00e9formations avec une grande pr\u00e9cision, il est \u00e9galement con\u00e7u pour une automatisation efficace, ce qui am\u00e9liore la productivit\u00e9 sans compromettre la pr\u00e9cision.<\/p><p>La machine Eagle V8000. V\u00e9ritable syst\u00e8me pionnier int\u00e9grant APS + AVI, elle offre des perspectives de vision multiples, qui garantissent une inspection compl\u00e8te, de la cr\u00e9ation du wafer jusqu&rsquo;au waffel tray. Mettant l&rsquo;accent sur l&rsquo;efficacit\u00e9 de l&rsquo;utilisateur, ses modes vont du tout automatique au fonctionnement sans intervention, ce qui permet de r\u00e9pondre \u00e0 divers besoins op\u00e9rationnels.<\/p><p>La machine JAI-3000 incorpore des syst\u00e8mes de vision 2D et 3D, sp\u00e9cialement con\u00e7us pour les inspections visuelles et de marquage des packages de type TSOP et BGA. Elle garantit que seuls les meilleurs dispositifs sont accept\u00e9s apr\u00e8s des inspections 2D\/3D et de marquage rigoureuses.<\/p><p>Con\u00e7u pour les wafers pr\u00e9alablement inspect\u00e9es, le JAP-3000 excelle dans la pr\u00e9cision, avec une pr\u00e9cision de positionnement de 0,01 mm. Son syst\u00e8me de vision double garantit un placement parfait des puces, s&rsquo;adaptant parfaitement aux diff\u00e9rentes configurations DDI.<\/p><p>Le Handler AOI Trooper-V pour wafer-level . V\u00e9ritable merveille \u00e0 grande vitesse, il peut inspecter un nombre stup\u00e9fiant de 70 000 dies en seulement 120 secondes. Avec son microscope avanc\u00e9, son objectif de haute qualit\u00e9 et ses diverses capacit\u00e9s de vision, Trooper-V incarne la nouvelle g\u00e9n\u00e9ration de test AOI.<\/p>\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t<div class=\"elementor-column elementor-col-50 elementor-top-column elementor-element elementor-element-50cea430\" data-id=\"50cea430\" data-element_type=\"column\">\n\t\t\t<div class=\"elementor-widget-wrap elementor-element-populated\">\n\t\t\t\t\t\t<div class=\"elementor-element elementor-element-140a678 elementor-widget elementor-widget-image-gallery\" data-id=\"140a678\" data-element_type=\"widget\" data-widget_type=\"image-gallery.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t<style>\/*! elementor - v3.19.0 - 28-02-2024 *\/\n.elementor-image-gallery .gallery-item{display:inline-block;text-align:center;vertical-align:top;width:100%;max-width:100%;margin:0 auto}.elementor-image-gallery .gallery-item 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class=\"elementor-post elementor-grid-item post-15924 page type-page status-publish has-post-thumbnail hentry\">\n\t\t\t\t<a class=\"elementor-post__thumbnail__link\" href=\"https:\/\/4jmsolutions.com\/fr\/equipement\/semiconducteur-detection-composants-discrets\/tests-et-finitions\/ioa\/jap-3000-systeme-automatique-de-mise-en-place-pour-les-wafers-pre-inspectes\/\" tabindex=\"-1\" >\n\t\t\t<div class=\"elementor-post__thumbnail\"><img decoding=\"async\" width=\"635\" height=\"463\" src=\"https:\/\/4jmsolutions.com\/wp-content\/uploads\/2022\/11\/jap-3000-thumbnail.png\" class=\"attachment-full size-full wp-image-13573\" alt=\"\" srcset=\"https:\/\/4jmsolutions.com\/wp-content\/uploads\/2022\/11\/jap-3000-thumbnail.png 635w, https:\/\/4jmsolutions.com\/wp-content\/uploads\/2022\/11\/jap-3000-thumbnail-300x219.png 300w\" sizes=\"(max-width: 635px) 100vw, 635px\" \/><\/div>\n\t\t<\/a>\n\t\t\t\t<div class=\"elementor-post__text\">\n\t\t\t\t<h3 class=\"elementor-post__title\">\n\t\t\t<a href=\"https:\/\/4jmsolutions.com\/fr\/equipement\/semiconducteur-detection-composants-discrets\/tests-et-finitions\/ioa\/jap-3000-systeme-automatique-de-mise-en-place-pour-les-wafers-pre-inspectes\/\" >\n\t\t\t\tJAP-3000 Titre : JAP-3000 Syst\u00e8me automatique de pr\u00e9l\u00e8vement et de placement pour les wafers pr\u00e9-inspect\u00e9s\t\t\t<\/a>\n\t\t<\/h3>\n\t\t\t\t<div class=\"elementor-post__excerpt\">\n\t\t\t<p>JAP-3000 Syst\u00e8me Pick &#038; Place pour wafer pr\u00e9-inspect\u00e9 Syst\u00e8me Pick &amp; Place automatique pour waferpr\u00e9-inspect\u00e9e Processus du wafer\u00a0 au Tray Facile \u00e0 appliquer divers DDI<\/p>\n\t\t<\/div>\n\t\t\t\t\t<div class=\"elementor-post__read-more-wrapper\">\n\t\t\n\t\t<a class=\"elementor-post__read-more\" href=\"https:\/\/4jmsolutions.com\/fr\/equipement\/semiconducteur-detection-composants-discrets\/tests-et-finitions\/ioa\/jap-3000-systeme-automatique-de-mise-en-place-pour-les-wafers-pre-inspectes\/\" aria-label=\"Read more about JAP-3000 Titre : JAP-3000 Syst\u00e8me automatique de pr\u00e9l\u00e8vement et de placement pour les wafers pr\u00e9-inspect\u00e9s\" tabindex=\"-1\" >\n\t\t\tRead More \u00bb\t\t<\/a>\n\n\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/article>\n\t\t\t\t<article class=\"elementor-post elementor-grid-item post-15918 page type-page status-publish has-post-thumbnail hentry\">\n\t\t\t\t<a class=\"elementor-post__thumbnail__link\" href=\"https:\/\/4jmsolutions.com\/fr\/equipement\/semiconducteur-detection-composants-discrets\/tests-et-finitions\/ioa\/jap-3100-automatic-pick-place-system-with-vision-inspection\/\" tabindex=\"-1\" >\n\t\t\t<div class=\"elementor-post__thumbnail\"><img loading=\"lazy\" decoding=\"async\" width=\"635\" height=\"463\" src=\"https:\/\/4jmsolutions.com\/wp-content\/uploads\/2022\/11\/jap-3100-thumbnail.png\" class=\"attachment-full size-full wp-image-13571\" alt=\"\" srcset=\"https:\/\/4jmsolutions.com\/wp-content\/uploads\/2022\/11\/jap-3100-thumbnail.png 635w, https:\/\/4jmsolutions.com\/wp-content\/uploads\/2022\/11\/jap-3100-thumbnail-300x219.png 300w\" sizes=\"(max-width: 635px) 100vw, 635px\" \/><\/div>\n\t\t<\/a>\n\t\t\t\t<div class=\"elementor-post__text\">\n\t\t\t\t<h3 class=\"elementor-post__title\">\n\t\t\t<a href=\"https:\/\/4jmsolutions.com\/fr\/equipement\/semiconducteur-detection-composants-discrets\/tests-et-finitions\/ioa\/jap-3100-automatic-pick-place-system-with-vision-inspection\/\" >\n\t\t\t\tJAP-3100 Automatic Pick &#038; Place System with Vision inspection\t\t\t<\/a>\n\t\t<\/h3>\n\t\t\t\t<div class=\"elementor-post__excerpt\">\n\t\t\t<p>JAP-3100 Pick &amp; Place System with Vision inspection Automatic Pick &amp; Place System with Vision inspection Wafer handling by magazine : Auto Wafer Loading &amp;<\/p>\n\t\t<\/div>\n\t\t\t\t\t<div class=\"elementor-post__read-more-wrapper\">\n\t\t\n\t\t<a class=\"elementor-post__read-more\" href=\"https:\/\/4jmsolutions.com\/fr\/equipement\/semiconducteur-detection-composants-discrets\/tests-et-finitions\/ioa\/jap-3100-automatic-pick-place-system-with-vision-inspection\/\" aria-label=\"Read more about JAP-3100 Automatic Pick &#038; Place System with Vision inspection\" tabindex=\"-1\" >\n\t\t\tRead More \u00bb\t\t<\/a>\n\n\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/article>\n\t\t\t\t<article class=\"elementor-post elementor-grid-item post-15906 page type-page status-publish has-post-thumbnail hentry\">\n\t\t\t\t<a class=\"elementor-post__thumbnail__link\" href=\"https:\/\/4jmsolutions.com\/fr\/equipement\/semiconducteur-detection-composants-discrets\/tests-et-finitions\/ioa\/jai-3000-2d-3d-auto-vision-systeme-vingt-20-para-outil-de-paquet-visuel-et-marquage-de-tsop-bga-types\/\" tabindex=\"-1\" >\n\t\t\t<div class=\"elementor-post__thumbnail\"><img loading=\"lazy\" decoding=\"async\" width=\"635\" height=\"463\" src=\"https:\/\/4jmsolutions.com\/wp-content\/uploads\/2022\/11\/jai-3000-thumbnail.png\" class=\"attachment-full size-full wp-image-13569\" alt=\"\" srcset=\"https:\/\/4jmsolutions.com\/wp-content\/uploads\/2022\/11\/jai-3000-thumbnail.png 635w, https:\/\/4jmsolutions.com\/wp-content\/uploads\/2022\/11\/jai-3000-thumbnail-300x219.png 300w\" sizes=\"(max-width: 635px) 100vw, 635px\" \/><\/div>\n\t\t<\/a>\n\t\t\t\t<div class=\"elementor-post__text\">\n\t\t\t\t<h3 class=\"elementor-post__title\">\n\t\t\t<a href=\"https:\/\/4jmsolutions.com\/fr\/equipement\/semiconducteur-detection-composants-discrets\/tests-et-finitions\/ioa\/jai-3000-2d-3d-auto-vision-systeme-vingt-20-para-outil-de-paquet-visuel-et-marquage-de-tsop-bga-types\/\" >\n\t\t\t\tJAI-3000 Syst\u00e8me de vision automatique 2D\/3D avec 20 outils para pour le visuel et le marquage d\u2019emballages de types TSOP et BGA\t\t\t<\/a>\n\t\t<\/h3>\n\t\t\t\t<div class=\"elementor-post__excerpt\">\n\t\t\t<p>JAI-3000 Syst\u00e8me de vision automatique 2D\/3D avec outil de 20 paras pour l\u2019inspection visuelle des emballages et le marquage des types TSOP, BGA Stations d&rsquo;inspection<\/p>\n\t\t<\/div>\n\t\t\t\t\t<div class=\"elementor-post__read-more-wrapper\">\n\t\t\n\t\t<a class=\"elementor-post__read-more\" href=\"https:\/\/4jmsolutions.com\/fr\/equipement\/semiconducteur-detection-composants-discrets\/tests-et-finitions\/ioa\/jai-3000-2d-3d-auto-vision-systeme-vingt-20-para-outil-de-paquet-visuel-et-marquage-de-tsop-bga-types\/\" aria-label=\"Read more about JAI-3000 Syst\u00e8me de vision automatique 2D\/3D avec 20 outils para pour le visuel et le marquage d\u2019emballages de types TSOP et BGA\" tabindex=\"-1\" >\n\t\t\tRead More \u00bb\t\t<\/a>\n\n\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/article>\n\t\t\t\t<article class=\"elementor-post elementor-grid-item post-15894 page type-page status-publish has-post-thumbnail hentry\">\n\t\t\t\t<a class=\"elementor-post__thumbnail__link\" href=\"https:\/\/4jmsolutions.com\/fr\/equipement\/semiconducteur-detection-composants-discrets\/tests-et-finitions\/ioa\/aoi-jai-2000-2d-3d-auto-vision-systeme-pour-paquet-visuel-et-marquage-de-tsop-bga-types\/\" tabindex=\"-1\" >\n\t\t\t<div class=\"elementor-post__thumbnail\"><img loading=\"lazy\" decoding=\"async\" width=\"635\" height=\"463\" src=\"https:\/\/4jmsolutions.com\/wp-content\/uploads\/2022\/11\/jai-2000-thumbnail-1.png\" class=\"attachment-full size-full wp-image-13567\" alt=\"\" srcset=\"https:\/\/4jmsolutions.com\/wp-content\/uploads\/2022\/11\/jai-2000-thumbnail-1.png 635w, https:\/\/4jmsolutions.com\/wp-content\/uploads\/2022\/11\/jai-2000-thumbnail-1-300x219.png 300w\" sizes=\"(max-width: 635px) 100vw, 635px\" \/><\/div>\n\t\t<\/a>\n\t\t\t\t<div class=\"elementor-post__text\">\n\t\t\t\t<h3 class=\"elementor-post__title\">\n\t\t\t<a href=\"https:\/\/4jmsolutions.com\/fr\/equipement\/semiconducteur-detection-composants-discrets\/tests-et-finitions\/ioa\/aoi-jai-2000-2d-3d-auto-vision-systeme-pour-paquet-visuel-et-marquage-de-tsop-bga-types\/\" >\n\t\t\t\tJAI-2000 Syst\u00e8me de vision automatique 2D \/ 3D pour l&rsquo;inspection visuelle et le marquage des types d&#8217;emballages TSOP et BGA\t\t\t<\/a>\n\t\t<\/h3>\n\t\t\t\t<div class=\"elementor-post__excerpt\">\n\t\t\t<p>JAI-2000 Syst\u00e8me de vision automatique 2D\/3D pour le visuel des emballages et le marquage des types TSOP, BGA Les appareils dans le trayde chargement sont<\/p>\n\t\t<\/div>\n\t\t\t\t\t<div class=\"elementor-post__read-more-wrapper\">\n\t\t\n\t\t<a class=\"elementor-post__read-more\" href=\"https:\/\/4jmsolutions.com\/fr\/equipement\/semiconducteur-detection-composants-discrets\/tests-et-finitions\/ioa\/aoi-jai-2000-2d-3d-auto-vision-systeme-pour-paquet-visuel-et-marquage-de-tsop-bga-types\/\" aria-label=\"Read more about JAI-2000 Syst\u00e8me de vision automatique 2D \/ 3D pour l&rsquo;inspection visuelle et le marquage des types d&#8217;emballages TSOP et BGA\" tabindex=\"-1\" >\n\t\t\tRead More \u00bb\t\t<\/a>\n\n\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/article>\n\t\t\t\t<article class=\"elementor-post elementor-grid-item post-15871 page type-page status-publish has-post-thumbnail hentry\">\n\t\t\t\t<a class=\"elementor-post__thumbnail__link\" href=\"https:\/\/4jmsolutions.com\/fr\/equipement\/semiconducteur-detection-composants-discrets\/tests-et-finitions\/ioa\/eagle-v8000-ddi-puce-auto-prelever-place-et-vision-inspection-en-line\/\" tabindex=\"-1\" >\n\t\t\t<div class=\"elementor-post__thumbnail\"><img loading=\"lazy\" decoding=\"async\" width=\"635\" height=\"463\" src=\"https:\/\/4jmsolutions.com\/wp-content\/uploads\/2022\/11\/eagle-v8000-thumbnail.png\" class=\"attachment-full size-full wp-image-13563\" alt=\"\" srcset=\"https:\/\/4jmsolutions.com\/wp-content\/uploads\/2022\/11\/eagle-v8000-thumbnail.png 635w, https:\/\/4jmsolutions.com\/wp-content\/uploads\/2022\/11\/eagle-v8000-thumbnail-300x219.png 300w\" sizes=\"(max-width: 635px) 100vw, 635px\" \/><\/div>\n\t\t<\/a>\n\t\t\t\t<div class=\"elementor-post__text\">\n\t\t\t\t<h3 class=\"elementor-post__title\">\n\t\t\t<a href=\"https:\/\/4jmsolutions.com\/fr\/equipement\/semiconducteur-detection-composants-discrets\/tests-et-finitions\/ioa\/eagle-v8000-ddi-puce-auto-prelever-place-et-vision-inspection-en-line\/\" >\n\t\t\t\tEagle V8000 Auto Pick &#038; Place et Inspection Vision en ligne de puce DDI\t\t\t<\/a>\n\t\t<\/h3>\n\t\t\t\t<div class=\"elementor-post__excerpt\">\n\t\t\t<p>Eagle V8000 DDI Chip Auto Pick &amp; Place et Vision Inspection InLine Premier syst\u00e8me combin\u00e9 APS + AVI au monde Wafer Vision, Under Vision, Top<\/p>\n\t\t<\/div>\n\t\t\t\t\t<div class=\"elementor-post__read-more-wrapper\">\n\t\t\n\t\t<a class=\"elementor-post__read-more\" href=\"https:\/\/4jmsolutions.com\/fr\/equipement\/semiconducteur-detection-composants-discrets\/tests-et-finitions\/ioa\/eagle-v8000-ddi-puce-auto-prelever-place-et-vision-inspection-en-line\/\" aria-label=\"Read more about Eagle V8000 Auto Pick &#038; Place et Inspection Vision en ligne de puce DDI\" tabindex=\"-1\" >\n\t\t\tRead More \u00bb\t\t<\/a>\n\n\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/article>\n\t\t\t\t<article class=\"elementor-post elementor-grid-item post-15883 page type-page status-publish has-post-thumbnail hentry\">\n\t\t\t\t<a class=\"elementor-post__thumbnail__link\" href=\"https:\/\/4jmsolutions.com\/fr\/equipement\/semiconducteur-detection-composants-discrets\/tests-et-finitions\/ioa\/aoi-jai-d302-puce-manipule-sur-gaufre-emballer-vision-verifier-triage-dechargement\/\" tabindex=\"-1\" >\n\t\t\t<div class=\"elementor-post__thumbnail\"><img loading=\"lazy\" decoding=\"async\" width=\"635\" height=\"463\" src=\"https:\/\/4jmsolutions.com\/wp-content\/uploads\/2022\/11\/jai-d302-thumbnail.png\" class=\"attachment-full size-full wp-image-13565\" alt=\"\" srcset=\"https:\/\/4jmsolutions.com\/wp-content\/uploads\/2022\/11\/jai-d302-thumbnail.png 635w, https:\/\/4jmsolutions.com\/wp-content\/uploads\/2022\/11\/jai-d302-thumbnail-300x219.png 300w\" sizes=\"(max-width: 635px) 100vw, 635px\" \/><\/div>\n\t\t<\/a>\n\t\t\t\t<div class=\"elementor-post__text\">\n\t\t\t\t<h3 class=\"elementor-post__title\">\n\t\t\t<a href=\"https:\/\/4jmsolutions.com\/fr\/equipement\/semiconducteur-detection-composants-discrets\/tests-et-finitions\/ioa\/aoi-jai-d302-puce-manipule-sur-gaufre-emballer-vision-verifier-triage-dechargement\/\" >\n\t\t\t\tJAI-D302 Puce g\u00e9r\u00e9e sur Waffle Pack, contr\u00f4le de vision, tri, d\u00e9chargement\t\t\t<\/a>\n\t\t<\/h3>\n\t\t\t\t<div class=\"elementor-post__excerpt\">\n\t\t\t<p>JAI-D302 Puce manipul\u00e9 sur Waffle Pack, Vision Check, Tri, D\u00e9chargement Temps de fonctionnement r\u00e9duit de l&rsquo;\u00e9quipement gr\u00e2ce au syst\u00e8me de chargement\/d\u00e9chargement Fonction de correction de<\/p>\n\t\t<\/div>\n\t\t\t\t\t<div class=\"elementor-post__read-more-wrapper\">\n\t\t\n\t\t<a class=\"elementor-post__read-more\" href=\"https:\/\/4jmsolutions.com\/fr\/equipement\/semiconducteur-detection-composants-discrets\/tests-et-finitions\/ioa\/aoi-jai-d302-puce-manipule-sur-gaufre-emballer-vision-verifier-triage-dechargement\/\" aria-label=\"Read more about JAI-D302 Puce g\u00e9r\u00e9e sur Waffle Pack, contr\u00f4le de vision, tri, d\u00e9chargement\" tabindex=\"-1\" >\n\t\t\tRead More \u00bb\t\t<\/a>\n\n\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/article>\n\t\t\t\t<article class=\"elementor-post elementor-grid-item post-15859 page type-page status-publish has-post-thumbnail hentry\">\n\t\t\t\t<a class=\"elementor-post__thumbnail__link\" href=\"https:\/\/4jmsolutions.com\/fr\/equipement\/semiconducteur-detection-composants-discrets\/tests-et-finitions\/ioa\/eagle-v8500-equipement-dinspection-par-vision\/\" tabindex=\"-1\" >\n\t\t\t<div class=\"elementor-post__thumbnail\"><img loading=\"lazy\" decoding=\"async\" width=\"635\" height=\"463\" src=\"https:\/\/4jmsolutions.com\/wp-content\/uploads\/2022\/11\/eagle-v8500-thumbnail.png\" class=\"attachment-full size-full wp-image-13561\" alt=\"\" srcset=\"https:\/\/4jmsolutions.com\/wp-content\/uploads\/2022\/11\/eagle-v8500-thumbnail.png 635w, https:\/\/4jmsolutions.com\/wp-content\/uploads\/2022\/11\/eagle-v8500-thumbnail-300x219.png 300w\" sizes=\"(max-width: 635px) 100vw, 635px\" \/><\/div>\n\t\t<\/a>\n\t\t\t\t<div class=\"elementor-post__text\">\n\t\t\t\t<h3 class=\"elementor-post__title\">\n\t\t\t<a href=\"https:\/\/4jmsolutions.com\/fr\/equipement\/semiconducteur-detection-composants-discrets\/tests-et-finitions\/ioa\/eagle-v8500-equipement-dinspection-par-vision\/\" >\n\t\t\t\tEagle V8500 Equipement d&rsquo;Inspection Par Vision\t\t\t<\/a>\n\t\t<\/h3>\n\t\t\t\t<div class=\"elementor-post__excerpt\">\n\t\t\t<p>Eagle V8500 Equipement d&rsquo;Inspection par Vision Equipement d&rsquo;inspection par vision 3.5D M\u00e9thode du faisceau fendu : premi\u00e8re application de l&rsquo;inspection PKG en Cor\u00e9e Fonction de<\/p>\n\t\t<\/div>\n\t\t\t\t\t<div class=\"elementor-post__read-more-wrapper\">\n\t\t\n\t\t<a class=\"elementor-post__read-more\" href=\"https:\/\/4jmsolutions.com\/fr\/equipement\/semiconducteur-detection-composants-discrets\/tests-et-finitions\/ioa\/eagle-v8500-equipement-dinspection-par-vision\/\" aria-label=\"Read more about Eagle V8500 Equipement d&rsquo;Inspection Par Vision\" tabindex=\"-1\" >\n\t\t\tRead More \u00bb\t\t<\/a>\n\n\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/article>\n\t\t\t\t<\/div>\n\t\t\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t<section data-particle_enable=\"false\" data-particle-mobile-disabled=\"false\" class=\"elementor-section elementor-top-section elementor-element elementor-element-a757ef6 elementor-section-boxed elementor-section-height-default elementor-section-height-default\" data-id=\"a757ef6\" data-element_type=\"section\">\n\t\t\t\t\t\t<div class=\"elementor-container elementor-column-gap-default\">\n\t\t\t\t\t<div class=\"elementor-column elementor-col-100 elementor-top-column elementor-element elementor-element-48d0c0f\" data-id=\"48d0c0f\" data-element_type=\"column\">\n\t\t\t<div class=\"elementor-widget-wrap elementor-element-populated\">\n\t\t\t\t\t\t<div class=\"elementor-element elementor-element-34cfa1b elementor-widget-divider--view-line_text elementor-widget-divider--element-align-center elementor-widget elementor-widget-divider\" data-id=\"34cfa1b\" data-element_type=\"widget\" data-widget_type=\"divider.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t<div class=\"elementor-divider\">\n\t\t\t<span class=\"elementor-divider-separator\">\n\t\t\t\t\t\t\t<h3 class=\"elementor-divider__text elementor-divider__element\">\n\t\t\t\tsyst\u00e8me d'inspection\t\t\t\t<\/h3>\n\t\t\t\t\t\t<\/span>\n\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t<section data-particle_enable=\"false\" data-particle-mobile-disabled=\"false\" class=\"elementor-section elementor-top-section elementor-element elementor-element-dbdcd94 elementor-section-boxed elementor-section-height-default elementor-section-height-default\" data-id=\"dbdcd94\" data-element_type=\"section\">\n\t\t\t\t\t\t<div class=\"elementor-container elementor-column-gap-default\">\n\t\t\t\t\t<div class=\"elementor-column elementor-col-100 elementor-top-column elementor-element elementor-element-6c1b405\" data-id=\"6c1b405\" data-element_type=\"column\">\n\t\t\t<div class=\"elementor-widget-wrap elementor-element-populated\">\n\t\t\t\t\t\t<div class=\"elementor-element elementor-element-e3e65b3 elementor-grid-3 elementor-grid-tablet-2 elementor-grid-mobile-1 elementor-posts--thumbnail-top elementor-widget elementor-widget-posts\" data-id=\"e3e65b3\" data-element_type=\"widget\" data-settings=\"{&quot;classic_columns&quot;:&quot;3&quot;,&quot;classic_columns_tablet&quot;:&quot;2&quot;,&quot;classic_columns_mobile&quot;:&quot;1&quot;,&quot;classic_row_gap&quot;:{&quot;unit&quot;:&quot;px&quot;,&quot;size&quot;:35,&quot;sizes&quot;:[]},&quot;classic_row_gap_tablet&quot;:{&quot;unit&quot;:&quot;px&quot;,&quot;size&quot;:&quot;&quot;,&quot;sizes&quot;:[]},&quot;classic_row_gap_mobile&quot;:{&quot;unit&quot;:&quot;px&quot;,&quot;size&quot;:&quot;&quot;,&quot;sizes&quot;:[]}}\" data-widget_type=\"posts.classic\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t<div class=\"elementor-posts-container elementor-posts elementor-posts--skin-classic elementor-grid\">\n\t\t\t\t<article class=\"elementor-post elementor-grid-item post-15986 page type-page status-publish has-post-thumbnail hentry industry-automotive industry-consumer-electronics maincategory-automated-vision-inspection-solutions package-automated-power-modules-apm package-double-side-cooling-power-module-dsc package-intelligent-power-modules-ipm package-power-integrated-modules-pim package-smart-power-modules-spm process-features-optional-features process-features-vision-inspection sub-category-igbt\">\n\t\t\t\t<a class=\"elementor-post__thumbnail__link\" href=\"https:\/\/4jmsolutions.com\/fr\/equipement\/semiconducteur-detection-composants-discrets\/tests-et-finitions\/ioa\/pm52-v-gestionnaire-demballage-aoi-final\/\" tabindex=\"-1\" >\n\t\t\t<div class=\"elementor-post__thumbnail\"><img loading=\"lazy\" decoding=\"async\" width=\"635\" height=\"463\" src=\"https:\/\/4jmsolutions.com\/wp-content\/uploads\/2022\/11\/pm52-v-thumbnail.png\" class=\"attachment-full size-full wp-image-13583\" alt=\"\" srcset=\"https:\/\/4jmsolutions.com\/wp-content\/uploads\/2022\/11\/pm52-v-thumbnail.png 635w, https:\/\/4jmsolutions.com\/wp-content\/uploads\/2022\/11\/pm52-v-thumbnail-300x219.png 300w\" sizes=\"(max-width: 635px) 100vw, 635px\" \/><\/div>\n\t\t<\/a>\n\t\t\t\t<div class=\"elementor-post__text\">\n\t\t\t\t<h3 class=\"elementor-post__title\">\n\t\t\t<a href=\"https:\/\/4jmsolutions.com\/fr\/equipement\/semiconducteur-detection-composants-discrets\/tests-et-finitions\/ioa\/pm52-v-gestionnaire-demballage-aoi-final\/\" >\n\t\t\t\tPM52-V : Handler d&#8217;emballage AOI final\t\t\t<\/a>\n\t\t<\/h3>\n\t\t\t\t<div class=\"elementor-post__excerpt\">\n\t\t\t<p>PM52-V : Handler d&#8217;emballage AOI final Le PM52-V est un handler de production de masse de concept lin\u00e9aire con\u00e7u pour effectuer des inspections finales sur<\/p>\n\t\t<\/div>\n\t\t\t\t\t<div class=\"elementor-post__read-more-wrapper\">\n\t\t\n\t\t<a class=\"elementor-post__read-more\" href=\"https:\/\/4jmsolutions.com\/fr\/equipement\/semiconducteur-detection-composants-discrets\/tests-et-finitions\/ioa\/pm52-v-gestionnaire-demballage-aoi-final\/\" aria-label=\"Read more about PM52-V : Handler d&#8217;emballage AOI final\" tabindex=\"-1\" >\n\t\t\tRead More \u00bb\t\t<\/a>\n\n\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/article>\n\t\t\t\t<article class=\"elementor-post elementor-grid-item post-15975 page type-page status-publish has-post-thumbnail hentry industry-automotive industry-consumer-electronics maincategory-automated-vision-inspection-solutions package-cmos-image-sensor package-die package-flip-chip package-silicon-carbide-sic process-features-bottom-camera process-features-short-wave-infrared-swir-imaging-technology process-features-vision-inspection sub-category-igbt sub-category-silicon-carbide-sic\">\n\t\t\t\t<a class=\"elementor-post__thumbnail__link\" href=\"https:\/\/4jmsolutions.com\/fr\/equipement\/semiconducteur-detection-composants-discrets\/tests-et-finitions\/ioa\/trooper-v-wafer-niveau-aoi-manipulateur-pour-semiconducteurs\/\" tabindex=\"-1\" >\n\t\t\t<div class=\"elementor-post__thumbnail\"><img loading=\"lazy\" decoding=\"async\" width=\"635\" height=\"463\" src=\"https:\/\/4jmsolutions.com\/wp-content\/uploads\/2022\/11\/trooper-v-wafer-level-aoi-handler-thumbnail-4.png\" class=\"attachment-full size-full wp-image-13581\" alt=\"\" srcset=\"https:\/\/4jmsolutions.com\/wp-content\/uploads\/2022\/11\/trooper-v-wafer-level-aoi-handler-thumbnail-4.png 635w, https:\/\/4jmsolutions.com\/wp-content\/uploads\/2022\/11\/trooper-v-wafer-level-aoi-handler-thumbnail-4-300x219.png 300w\" sizes=\"(max-width: 635px) 100vw, 635px\" \/><\/div>\n\t\t<\/a>\n\t\t\t\t<div class=\"elementor-post__text\">\n\t\t\t\t<h3 class=\"elementor-post__title\">\n\t\t\t<a href=\"https:\/\/4jmsolutions.com\/fr\/equipement\/semiconducteur-detection-composants-discrets\/tests-et-finitions\/ioa\/trooper-v-wafer-niveau-aoi-manipulateur-pour-semiconducteurs\/\" >\n\t\t\t\tTrooper-V: Handler AOI au niveau des wafers pour semi-conducteurs\t\t\t<\/a>\n\t\t<\/h3>\n\t\t\t\t<div class=\"elementor-post__excerpt\">\n\t\t\t<p>Trooper-V: Handler AOI au niveau des wafers pour semi-conducteurs Trooper-V est un handler AOI haute vitesse de niveau sup\u00e9rieur con\u00e7u pour les packages au niveau<\/p>\n\t\t<\/div>\n\t\t\t\t\t<div class=\"elementor-post__read-more-wrapper\">\n\t\t\n\t\t<a class=\"elementor-post__read-more\" href=\"https:\/\/4jmsolutions.com\/fr\/equipement\/semiconducteur-detection-composants-discrets\/tests-et-finitions\/ioa\/trooper-v-wafer-niveau-aoi-manipulateur-pour-semiconducteurs\/\" aria-label=\"Read more about Trooper-V: Handler AOI au niveau des wafers pour semi-conducteurs\" tabindex=\"-1\" >\n\t\t\tRead More \u00bb\t\t<\/a>\n\n\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/article>\n\t\t\t\t<article class=\"elementor-post elementor-grid-item post-15964 page type-page status-publish has-post-thumbnail hentry industry-consumer-electronics industry-semiconductor maincategory-automated-vision-inspection-solutions package-led package-qfn package-soic package-sop package-sot process-features-empty-pocket-count-extra-less-quantity-count-orientation-unit-overturned-leader-and-trailer-pocket-count process-features-vision-inspection sub-category-integrated-circuits\">\n\t\t\t\t<a class=\"elementor-post__thumbnail__link\" href=\"https:\/\/4jmsolutions.com\/fr\/equipement\/semiconducteur-detection-composants-discrets\/tests-et-finitions\/ioa\/pm42-rt-controleur-dinspection-de-la-vision-de-bobine-a-bobine\/\" tabindex=\"-1\" >\n\t\t\t<div class=\"elementor-post__thumbnail\"><img loading=\"lazy\" decoding=\"async\" width=\"635\" height=\"463\" src=\"https:\/\/4jmsolutions.com\/wp-content\/uploads\/2022\/11\/pm42dt-thumbnail.png\" class=\"attachment-full size-full wp-image-13579\" alt=\"\" srcset=\"https:\/\/4jmsolutions.com\/wp-content\/uploads\/2022\/11\/pm42dt-thumbnail.png 635w, https:\/\/4jmsolutions.com\/wp-content\/uploads\/2022\/11\/pm42dt-thumbnail-300x219.png 300w\" sizes=\"(max-width: 635px) 100vw, 635px\" \/><\/div>\n\t\t<\/a>\n\t\t\t\t<div class=\"elementor-post__text\">\n\t\t\t\t<h3 class=\"elementor-post__title\">\n\t\t\t<a href=\"https:\/\/4jmsolutions.com\/fr\/equipement\/semiconducteur-detection-composants-discrets\/tests-et-finitions\/ioa\/pm42-rt-controleur-dinspection-de-la-vision-de-bobine-a-bobine\/\" >\n\t\t\t\tPM42-RT Handler d&rsquo;inspection par vision bobine \u00e0 bobine\t\t\t<\/a>\n\t\t<\/h3>\n\t\t\t\t<div class=\"elementor-post__excerpt\">\n\t\t\t<p>PM42-RT Handler d\u2019inspection de vision bobine \u00e0 bobine Il offre la solution pour automatiser enti\u00e8rement l\u2019inspection visuelle post-scellage de la sortie bobine \u00e0 bobine. Le<\/p>\n\t\t<\/div>\n\t\t\t\t\t<div class=\"elementor-post__read-more-wrapper\">\n\t\t\n\t\t<a class=\"elementor-post__read-more\" href=\"https:\/\/4jmsolutions.com\/fr\/equipement\/semiconducteur-detection-composants-discrets\/tests-et-finitions\/ioa\/pm42-rt-controleur-dinspection-de-la-vision-de-bobine-a-bobine\/\" aria-label=\"Read more about PM42-RT Handler d&rsquo;inspection par vision bobine \u00e0 bobine\" tabindex=\"-1\" >\n\t\t\tRead More \u00bb\t\t<\/a>\n\n\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/article>\n\t\t\t\t<article class=\"elementor-post elementor-grid-item post-15951 page type-page status-publish has-post-thumbnail hentry industry-consumer-electronics industry-industrial-and-medical maincategory-automated-vision-inspection-solutions package-capacitors package-component-modules package-connectors package-discrete-ics package-intravenous-catheters package-lancets package-led package-metal-cores package-transistors process-features-vision-inspection sub-category-integrated-circuits sub-category-led sub-category-medical-device\">\n\t\t\t\t<a class=\"elementor-post__thumbnail__link\" href=\"https:\/\/4jmsolutions.com\/fr\/equipement\/semiconducteur-detection-composants-discrets\/tests-et-finitions\/ioa\/pm36-pm36xl-tourelle-de-verre-base-vision-manipulateur-dinspection\/\" tabindex=\"-1\" >\n\t\t\t<div class=\"elementor-post__thumbnail\"><img loading=\"lazy\" decoding=\"async\" width=\"635\" height=\"463\" src=\"https:\/\/4jmsolutions.com\/wp-content\/uploads\/2022\/11\/pm36-pm36xl-thumbnail.png\" class=\"attachment-full size-full wp-image-13577\" alt=\"\" srcset=\"https:\/\/4jmsolutions.com\/wp-content\/uploads\/2022\/11\/pm36-pm36xl-thumbnail.png 635w, https:\/\/4jmsolutions.com\/wp-content\/uploads\/2022\/11\/pm36-pm36xl-thumbnail-300x219.png 300w\" sizes=\"(max-width: 635px) 100vw, 635px\" \/><\/div>\n\t\t<\/a>\n\t\t\t\t<div class=\"elementor-post__text\">\n\t\t\t\t<h3 class=\"elementor-post__title\">\n\t\t\t<a href=\"https:\/\/4jmsolutions.com\/fr\/equipement\/semiconducteur-detection-composants-discrets\/tests-et-finitions\/ioa\/pm36-pm36xl-tourelle-de-verre-base-vision-manipulateur-dinspection\/\" >\n\t\t\t\tPM36 \/ PM36XL Handler d&rsquo;inspection par vision \u00e0 base de tourelle en verre\t\t\t<\/a>\n\t\t<\/h3>\n\t\t\t\t<div class=\"elementor-post__excerpt\">\n\t\t\t<p>PM36 \/ PM36XL Handler d&rsquo;inspection par vision \u00e0 base de tourelle en verre Il s&rsquo;agit d&rsquo;un handler de tri par vision \u00e0 grande vitesse con\u00e7u<\/p>\n\t\t<\/div>\n\t\t\t\t\t<div class=\"elementor-post__read-more-wrapper\">\n\t\t\n\t\t<a class=\"elementor-post__read-more\" href=\"https:\/\/4jmsolutions.com\/fr\/equipement\/semiconducteur-detection-composants-discrets\/tests-et-finitions\/ioa\/pm36-pm36xl-tourelle-de-verre-base-vision-manipulateur-dinspection\/\" aria-label=\"Read more about PM36 \/ PM36XL Handler d&rsquo;inspection par vision \u00e0 base de tourelle en verre\" tabindex=\"-1\" >\n\t\t\tRead More \u00bb\t\t<\/a>\n\n\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/article>\n\t\t\t\t<article class=\"elementor-post elementor-grid-item post-15937 page type-page status-publish has-post-thumbnail hentry industry-automotive industry-consumer-electronics maincategory-automated-vision-inspection-solutions package-discrete-dfn package-leaded-soic package-msop package-qfn package-sc70 package-sc79 package-sod package-sot package-to252 package-to263 package-tssop process-features-bulk-sorting process-features-laser-marking process-features-tape-sorting process-features-tube-sorting process-features-vision-inspection sub-category-semiconductor\">\n\t\t\t\t<a class=\"elementor-post__thumbnail__link\" href=\"https:\/\/4jmsolutions.com\/fr\/equipement\/semiconducteur-detection-composants-discrets\/tests-et-finitions\/ioa\/pm35-v-base-de-la-tourelle-gestionnaire-dinspection-de-vision\/\" tabindex=\"-1\" >\n\t\t\t<div class=\"elementor-post__thumbnail\"><img loading=\"lazy\" decoding=\"async\" width=\"635\" height=\"463\" src=\"https:\/\/4jmsolutions.com\/wp-content\/uploads\/2022\/11\/PM35-V-thumbnail.png\" class=\"attachment-full size-full wp-image-13575\" alt=\"\" srcset=\"https:\/\/4jmsolutions.com\/wp-content\/uploads\/2022\/11\/PM35-V-thumbnail.png 635w, https:\/\/4jmsolutions.com\/wp-content\/uploads\/2022\/11\/PM35-V-thumbnail-300x219.png 300w\" sizes=\"(max-width: 635px) 100vw, 635px\" \/><\/div>\n\t\t<\/a>\n\t\t\t\t<div class=\"elementor-post__text\">\n\t\t\t\t<h3 class=\"elementor-post__title\">\n\t\t\t<a href=\"https:\/\/4jmsolutions.com\/fr\/equipement\/semiconducteur-detection-composants-discrets\/tests-et-finitions\/ioa\/pm35-v-base-de-la-tourelle-gestionnaire-dinspection-de-vision\/\" >\n\t\t\t\tPM35-V Handler d&rsquo;inspection par vision \u00e0 base de tourelle\t\t\t<\/a>\n\t\t<\/h3>\n\t\t\t\t<div class=\"elementor-post__excerpt\">\n\t\t\t<p>PM35-V Handler d&rsquo;inspection par vision \u00e0 base de tourelle Une vision de base de tourelle \u00e0 grande vitesse plus pratique con\u00e7ue pour les packages avec<\/p>\n\t\t<\/div>\n\t\t\t\t\t<div class=\"elementor-post__read-more-wrapper\">\n\t\t\n\t\t<a class=\"elementor-post__read-more\" href=\"https:\/\/4jmsolutions.com\/fr\/equipement\/semiconducteur-detection-composants-discrets\/tests-et-finitions\/ioa\/pm35-v-base-de-la-tourelle-gestionnaire-dinspection-de-vision\/\" aria-label=\"Read more about PM35-V Handler d&rsquo;inspection par vision \u00e0 base de tourelle\" tabindex=\"-1\" >\n\t\t\tRead More \u00bb\t\t<\/a>\n\n\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/article>\n\t\t\t\t<\/div>\n\t\t\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-91f4544 elementor-widget-divider--view-line_text elementor-widget-divider--element-align-center elementor-widget elementor-widget-divider\" data-id=\"91f4544\" data-element_type=\"widget\" id=\"aoi-after-surface-mounting\" data-widget_type=\"divider.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t<div class=\"elementor-divider\">\n\t\t\t<span class=\"elementor-divider-separator\">\n\t\t\t\t\t\t\t<h3 class=\"elementor-divider__text elementor-divider__element\">\n\t\t\t\tAOI apr\u00e8s montage en surface\t\t\t\t<\/h3>\n\t\t\t\t\t\t<\/span>\n\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-a410d0b elementor-grid-3 elementor-grid-tablet-2 elementor-grid-mobile-1 elementor-posts--thumbnail-top elementor-widget elementor-widget-posts\" data-id=\"a410d0b\" data-element_type=\"widget\" data-settings=\"{&quot;classic_masonry&quot;:&quot;yes&quot;,&quot;classic_columns&quot;:&quot;3&quot;,&quot;classic_columns_tablet&quot;:&quot;2&quot;,&quot;classic_columns_mobile&quot;:&quot;1&quot;,&quot;classic_row_gap&quot;:{&quot;unit&quot;:&quot;px&quot;,&quot;size&quot;:35,&quot;sizes&quot;:[]},&quot;classic_row_gap_tablet&quot;:{&quot;unit&quot;:&quot;px&quot;,&quot;size&quot;:&quot;&quot;,&quot;sizes&quot;:[]},&quot;classic_row_gap_mobile&quot;:{&quot;unit&quot;:&quot;px&quot;,&quot;size&quot;:&quot;&quot;,&quot;sizes&quot;:[]}}\" data-widget_type=\"posts.classic\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t<div class=\"elementor-posts-container elementor-posts elementor-posts--skin-classic elementor-grid\">\n\t\t\t\t<article class=\"elementor-post elementor-grid-item post-16010 page type-page status-publish has-post-thumbnail hentry\">\n\t\t\t\t<a class=\"elementor-post__thumbnail__link\" href=\"https:\/\/4jmsolutions.com\/fr\/equipement\/semiconducteur-detection-composants-discrets\/tests-et-finitions\/ioa\/mv-6e-omni-series\/\" tabindex=\"-1\" >\n\t\t\t<div class=\"elementor-post__thumbnail\"><img loading=\"lazy\" decoding=\"async\" width=\"300\" height=\"219\" src=\"https:\/\/4jmsolutions.com\/wp-content\/uploads\/2022\/11\/mv-6e-omni-series-thumbnail-300x219.png\" class=\"attachment-medium size-medium wp-image-13589\" alt=\"\" srcset=\"https:\/\/4jmsolutions.com\/wp-content\/uploads\/2022\/11\/mv-6e-omni-series-thumbnail-300x219.png 300w, https:\/\/4jmsolutions.com\/wp-content\/uploads\/2022\/11\/mv-6e-omni-series-thumbnail.png 635w\" sizes=\"(max-width: 300px) 100vw, 300px\" \/><\/div>\n\t\t<\/a>\n\t\t\t\t<div class=\"elementor-post__text\">\n\t\t\t\t<h3 class=\"elementor-post__title\">\n\t\t\t<a href=\"https:\/\/4jmsolutions.com\/fr\/equipement\/semiconducteur-detection-composants-discrets\/tests-et-finitions\/ioa\/mv-6e-omni-series\/\" >\n\t\t\t\tS\u00e9rie MV-6E OMNI\t\t\t<\/a>\n\t\t<\/h3>\n\t\t\t\t<div class=\"elementor-post__excerpt\">\n\t\t\t<p>S\u00e9rie MV-6E OMNI L\u2019AOI 3D optimal pour am\u00e9liorer la productivit\u00e9 L&rsquo;AOI 3D la plus performante au monde Technologie d&rsquo;inspection 3D moir\u00e9e \u00e0 8 projections num\u00e9riques<\/p>\n\t\t<\/div>\n\t\t\n\t\t<a class=\"elementor-post__read-more\" href=\"https:\/\/4jmsolutions.com\/fr\/equipement\/semiconducteur-detection-composants-discrets\/tests-et-finitions\/ioa\/mv-6e-omni-series\/\" aria-label=\"Read more about S\u00e9rie MV-6E OMNI\" tabindex=\"-1\" >\n\t\t\tRead More \u00bb\t\t<\/a>\n\n\t\t\t\t<\/div>\n\t\t\t\t<\/article>\n\t\t\t\t<article class=\"elementor-post elementor-grid-item post-15996 page type-page status-publish has-post-thumbnail hentry\">\n\t\t\t\t<a class=\"elementor-post__thumbnail__link\" href=\"https:\/\/4jmsolutions.com\/fr\/equipement\/semiconducteur-detection-composants-discrets\/tests-et-finitions\/ioa\/mv-3-series\/\" tabindex=\"-1\" >\n\t\t\t<div class=\"elementor-post__thumbnail\"><img loading=\"lazy\" decoding=\"async\" width=\"300\" height=\"219\" src=\"https:\/\/4jmsolutions.com\/wp-content\/uploads\/2022\/11\/mv-3-series-thumbnail-1-300x219.png\" class=\"attachment-medium size-medium wp-image-13587\" alt=\"\" srcset=\"https:\/\/4jmsolutions.com\/wp-content\/uploads\/2022\/11\/mv-3-series-thumbnail-1-300x219.png 300w, https:\/\/4jmsolutions.com\/wp-content\/uploads\/2022\/11\/mv-3-series-thumbnail-1.png 635w\" sizes=\"(max-width: 300px) 100vw, 300px\" \/><\/div>\n\t\t<\/a>\n\t\t\t\t<div class=\"elementor-post__text\">\n\t\t\t\t<h3 class=\"elementor-post__title\">\n\t\t\t<a href=\"https:\/\/4jmsolutions.com\/fr\/equipement\/semiconducteur-detection-composants-discrets\/tests-et-finitions\/ioa\/mv-3-series\/\" >\n\t\t\t\tS\u00e9rie MV-3\t\t\t<\/a>\n\t\t<\/h3>\n\t\t\t\t<div class=\"elementor-post__excerpt\">\n\t\t\t<p>S\u00e9rie MV-3 AOI 2D hors ligne polyvalent Excellentes performances d&rsquo;inspection Inspection de la composante de r\u00e9flexion diffuse, OCR, micro fissure pr\u00e9cis\u00e9ment par \u00e9clairage couleur coaxial<\/p>\n\t\t<\/div>\n\t\t\n\t\t<a class=\"elementor-post__read-more\" href=\"https:\/\/4jmsolutions.com\/fr\/equipement\/semiconducteur-detection-composants-discrets\/tests-et-finitions\/ioa\/mv-3-series\/\" aria-label=\"Read more about S\u00e9rie MV-3\" tabindex=\"-1\" >\n\t\t\tRead More \u00bb\t\t<\/a>\n\n\t\t\t\t<\/div>\n\t\t\t\t<\/article>\n\t\t\t\t<\/div>\n\t\t\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t<\/div>\n\t\t","protected":false},"excerpt":{"rendered":"<p>Machines AOI pour Wafers , Dies et semi-conducteurs encapsul\u00e9s 4JMSolutions est en train de transformer ce secteur en proposant une gamme de machines d&rsquo;inspection optique automatis\u00e9es et sophistiqu\u00e9es, sp\u00e9cialement con\u00e7ues pour les wafers , les Dies et les semi-conducteurs encapsul\u00e9s. Voici quelques-unes de nos machines AOI: La machine Eagle V8500, syst\u00e8me d&rsquo;inspection par vision 3,5D, [&hellip;]<\/p>\n","protected":false},"author":1,"featured_media":13559,"parent":14860,"menu_order":164,"comment_status":"closed","ping_status":"closed","template":"","meta":{"footnotes":""},"industry":[],"maincategory":[],"package":[],"process-features":[],"sub-category":[],"acf":[],"yoast_head":"<!-- This site is optimized with the Yoast SEO Premium plugin v20.5 (Yoast SEO v22.1) - https:\/\/yoast.com\/wordpress\/plugins\/seo\/ -->\n<title>Machines IOA pour Wafers , Dies et semi-conducteurs encapsul\u00e9s - 4JMSolutions<\/title>\n<meta name=\"description\" content=\"We are leading provider of AOI systems, starting from Wafer inspection to Post-Seal Inspection, providing everything to ensure high quality\" \/>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/4jmsolutions.com\/fr\/tests-et-finitions\/ioa\/\" \/>\n<meta property=\"og:locale\" content=\"fr_FR\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"AOI pour semi-conducteurs\" \/>\n<meta property=\"og:description\" content=\"We are leading provider of AOI systems, starting from Wafer inspection to Post-Seal Inspection, providing everything to ensure high quality\" \/>\n<meta property=\"og:url\" content=\"https:\/\/4jmsolutions.com\/fr\/tests-et-finitions\/ioa\/\" \/>\n<meta property=\"og:site_name\" content=\"4JMSolutions\" \/>\n<meta property=\"article:modified_time\" content=\"2024-01-24T10:38:54+00:00\" \/>\n<meta property=\"og:image\" content=\"https:\/\/4jmsolutions.com\/wp-content\/uploads\/2022\/11\/AOI-thumbnail.png\" \/>\n\t<meta property=\"og:image:width\" content=\"635\" \/>\n\t<meta property=\"og:image:height\" content=\"463\" \/>\n\t<meta property=\"og:image:type\" content=\"image\/png\" \/>\n<meta name=\"twitter:card\" content=\"summary_large_image\" \/>\n<meta name=\"twitter:label1\" content=\"Dur\u00e9e de lecture estim\u00e9e\" \/>\n\t<meta name=\"twitter:data1\" content=\"2 minutes\" \/>\n<script type=\"application\/ld+json\" class=\"yoast-schema-graph\">{\"@context\":\"https:\/\/schema.org\",\"@graph\":[{\"@type\":\"WebPage\",\"@id\":\"https:\/\/4jmsolutions.com\/fr\/tests-et-finitions\/ioa\/\",\"url\":\"https:\/\/4jmsolutions.com\/fr\/tests-et-finitions\/ioa\/\",\"name\":\"Machines IOA pour Wafers , Dies et semi-conducteurs encapsul\u00e9s - 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