{"id":15731,"date":"2022-10-03T11:23:58","date_gmt":"2022-10-03T11:23:58","guid":{"rendered":"https:\/\/newsite.com\/equipement\/semiconducteur-detection-composants-discrets\/tests-et-finitions\/deverminage\/wafer-level-power-device-burn-in-handler\/"},"modified":"2024-02-28T18:15:33","modified_gmt":"2024-02-28T18:15:33","slug":"handler-de-burn-in-pour-dispositifs-de-puissance-au-niveau-du-wafer","status":"publish","type":"page","link":"https:\/\/4jmsolutions.com\/fr\/equipement\/semiconducteur-detection-composants-discrets\/tests-et-finitions\/deverminage\/handler-de-burn-in-pour-dispositifs-de-puissance-au-niveau-du-wafer\/","title":{"rendered":"Handler de Burn-in pour Dispositifs de puissance au niveau du Wafer"},"content":{"rendered":"\t\t<div data-elementor-type=\"wp-page\" data-elementor-id=\"15731\" class=\"elementor elementor-15731\" data-elementor-post-type=\"page\">\n\t\t\t\t\t\t<section data-particle_enable=\"false\" data-particle-mobile-disabled=\"false\" class=\"elementor-section elementor-top-section elementor-element elementor-element-2222cce5 elementor-section-stretched elementor-section-boxed elementor-section-height-default elementor-section-height-default\" data-id=\"2222cce5\" data-element_type=\"section\" data-settings=\"{&quot;stretch_section&quot;:&quot;section-stretched&quot;,&quot;animation&quot;:&quot;none&quot;}\">\n\t\t\t\t\t\t<div class=\"elementor-container elementor-column-gap-default\">\n\t\t\t\t\t<div class=\"elementor-column elementor-col-50 elementor-top-column elementor-element elementor-element-23027411\" data-id=\"23027411\" data-element_type=\"column\">\n\t\t\t<div class=\"elementor-widget-wrap elementor-element-populated\">\n\t\t\t\t\t\t<div class=\"elementor-element elementor-element-5e32de53 elementor-widget elementor-widget-heading\" data-id=\"5e32de53\" data-element_type=\"widget\" data-widget_type=\"heading.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t<style>\/*! elementor - v3.19.0 - 28-02-2024 *\/\n.elementor-heading-title{padding:0;margin:0;line-height:1}.elementor-widget-heading .elementor-heading-title[class*=elementor-size-]>a{color:inherit;font-size:inherit;line-height:inherit}.elementor-widget-heading .elementor-heading-title.elementor-size-small{font-size:15px}.elementor-widget-heading .elementor-heading-title.elementor-size-medium{font-size:19px}.elementor-widget-heading .elementor-heading-title.elementor-size-large{font-size:29px}.elementor-widget-heading .elementor-heading-title.elementor-size-xl{font-size:39px}.elementor-widget-heading .elementor-heading-title.elementor-size-xxl{font-size:59px}<\/style><h5 class=\"elementor-heading-title elementor-size-default\">Handler de Burn-in pour Dispositifs de Puissance au Niveau du Wafer <\/h5>\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-7102aed3 elementor-widget elementor-widget-text-editor\" data-id=\"7102aed3\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t<style>\/*! elementor - v3.19.0 - 28-02-2024 *\/\n.elementor-widget-text-editor.elementor-drop-cap-view-stacked .elementor-drop-cap{background-color:#69727d;color:#fff}.elementor-widget-text-editor.elementor-drop-cap-view-framed .elementor-drop-cap{color:#69727d;border:3px solid;background-color:transparent}.elementor-widget-text-editor:not(.elementor-drop-cap-view-default) .elementor-drop-cap{margin-top:8px}.elementor-widget-text-editor:not(.elementor-drop-cap-view-default) .elementor-drop-cap-letter{width:1em;height:1em}.elementor-widget-text-editor .elementor-drop-cap{float:left;text-align:center;line-height:1;font-size:50px}.elementor-widget-text-editor .elementor-drop-cap-letter{display:inline-block}<\/style>\t\t\t\t<p class=\"mbr-text mbr-fonts-style mb-4 display-7\">Il s&rsquo;agit du dernier syst\u00e8me de test de Burn-in au niveau du wafer con\u00e7u pour les dispositifs de puissance. Ce testeur innovant permet d&rsquo;accueillir 2 tests d&rsquo;eau en parall\u00e8le et 480 tests de puces en parall\u00e8le par wafer. Canaux de pilotage ind\u00e9pendants pour la mesure simultan\u00e9e de la tension et du courant ainsi que pour la surveillance de la temp\u00e9rature. Con\u00e7u avec une chambre d&rsquo;\u00e9tanch\u00e9it\u00e9 pour accueillir des gaz inertes tels que l&rsquo;azote et des gaz de suppression d&rsquo;arc. Elle prot\u00e8ge les objets sous test de l&rsquo;arc \u00e9lectrique et de l&rsquo;oxydation tout en maintenant le testeur dans un \u00e9tat de temp\u00e9rature op\u00e9rationnelle sans surchauffe.<\/p><div class=\"mbr-text mbr-fonts-style counter-container display-7\"><ul><li class=\"\">Incorpor\u00e9 avec des handlers enti\u00e8rement automatis\u00e9s<\/li><li class=\"\">Solution tout-en-un avec des chambres de test int\u00e9gr\u00e9es<\/li><li class=\"\">Profil de burn-in de haut niveau d\u00e9fini par l&rsquo;utilisateur (mode continu ou par impulsion)<\/li><li class=\"\">Int\u00e9gr\u00e9 au syst\u00e8me de refroidissement \u00e0 l&rsquo;azote<\/li><li class=\"\">Chargement et d\u00e9chargement ais\u00e9s des tuiles de substrat<\/li><li class=\"\">Profil de temp\u00e9rature programmable<\/li><li class=\"\">Entr\u00e9e\/sortie : Wafer<\/li><li class=\"\">UPH jusqu&rsquo;\u00e0 720 unit\u00e9s<\/li><li class=\"\">Dur\u00e9e de burn-in programmable<\/li><li class=\"\">Source de tension de drain : Jusqu&rsquo;\u00e0 3 000 V DC<\/li><li class=\"\">Param\u00e8tres de test Vth, IGSS, IDSS, VDSon<\/li><li class=\"\">Pr\u00e9cision de la mesure du courant de fuite : 1%.<\/li><li class=\"\">Temps de mont\u00e9e en temp\u00e9rature : 15 minutes (de la temp\u00e9rature ambiante \u00e0 150\u00b0C)<\/li><li class=\"\">Tol\u00e9rance de temp\u00e9rature +5\u00b0C<\/li><\/ul><\/div>\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-7ddb80ec elementor-align-left elementor-tablet-align-center elementor-mobile-align-center elementor-invisible elementor-widget elementor-widget-button\" data-id=\"7ddb80ec\" data-element_type=\"widget\" data-settings=\"{&quot;_animation&quot;:&quot;slideInUp&quot;}\" data-widget_type=\"button.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t<div class=\"elementor-button-wrapper\">\n\t\t\t<a class=\"elementor-button elementor-button-link elementor-size-md\" 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elementor-element-5b96b91c elementor-posts--thumbnail-none elementor-grid-3 elementor-grid-tablet-2 elementor-grid-mobile-1 elementor-card-shadow-yes elementor-posts__hover-gradient elementor-widget elementor-widget-posts\" data-id=\"5b96b91c\" data-element_type=\"widget\" data-settings=\"{&quot;cards_columns&quot;:&quot;3&quot;,&quot;cards_columns_tablet&quot;:&quot;2&quot;,&quot;cards_columns_mobile&quot;:&quot;1&quot;,&quot;cards_row_gap&quot;:{&quot;unit&quot;:&quot;px&quot;,&quot;size&quot;:35,&quot;sizes&quot;:[]},&quot;cards_row_gap_tablet&quot;:{&quot;unit&quot;:&quot;px&quot;,&quot;size&quot;:&quot;&quot;,&quot;sizes&quot;:[]},&quot;cards_row_gap_mobile&quot;:{&quot;unit&quot;:&quot;px&quot;,&quot;size&quot;:&quot;&quot;,&quot;sizes&quot;:[]}}\" data-widget_type=\"posts.cards\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t<link rel=\"stylesheet\" href=\"http:\/\/4jmsolutions.com\/wp-content\/plugins\/elementor-pro\/assets\/css\/widget-posts.min.css\">\t\t<div class=\"elementor-posts-container elementor-posts elementor-posts--skin-cards elementor-grid\">\n\t\t\t\t<article class=\"elementor-post elementor-grid-item post-15742 page type-page status-publish has-post-thumbnail hentry\">\n\t\t\t<div class=\"elementor-post__card\">\n\t\t\t\t<div class=\"elementor-post__text\">\n\t\t\t\t<h3 class=\"elementor-post__title\">\n\t\t\t<a href=\"https:\/\/4jmsolutions.com\/fr\/equipement\/semiconducteur-detection-composants-discrets\/tests-et-finitions\/deverminage\/handler-de-burn-in-pour-dispositifs-de-puissance-au-niveau-du-wafer-2\/\" >\n\t\t\t\tHandler de Burn-in pour Dispositifs de puissance au niveau du Wafer\t\t\t<\/a>\n\t\t<\/h3>\n\t\t\t\t<div class=\"elementor-post__excerpt\">\n\t\t\t<p>Handler de Burn-in pour Dispositifs de Puissance au Niveau du Wafer Il s&rsquo;agit du dernier syst\u00e8me de test de Burn-in au niveau du wafer con\u00e7u<\/p>\n\t\t<\/div>\n\t\t\t\t\t<div class=\"elementor-post__read-more-wrapper\">\n\t\t\n\t\t<a class=\"elementor-post__read-more\" href=\"https:\/\/4jmsolutions.com\/fr\/equipement\/semiconducteur-detection-composants-discrets\/tests-et-finitions\/deverminage\/handler-de-burn-in-pour-dispositifs-de-puissance-au-niveau-du-wafer-2\/\" aria-label=\"Read more about Handler de Burn-in pour Dispositifs de puissance au niveau du Wafer\" tabindex=\"-1\" >\n\t\t\tRead More \u00bb\t\t<\/a>\n\n\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/article>\n\t\t\t\t<article class=\"elementor-post elementor-grid-item post-15719 page type-page status-publish has-post-thumbnail hentry industry-consumer-electronics industry-led maincategory-test-solutions-wafer-level-vcsel package-led package-micro-led package-vcsel process-features-easy-load-unloading-of-substrate-tiles process-features-modular-di-water-cooling-system-for-easy-maintenance process-features-programmable-temperature-profile process-features-test process-features-user-defined-burn-in-profile-continuous-or-pulse-mode-2\">\n\t\t\t<div class=\"elementor-post__card\">\n\t\t\t\t<div class=\"elementor-post__text\">\n\t\t\t\t<h3 class=\"elementor-post__title\">\n\t\t\t<a href=\"https:\/\/4jmsolutions.com\/fr\/equipement\/semiconducteur-detection-composants-discrets\/tests-et-finitions\/deverminage\/trooper-bi-handler-de-burn-in-pour-vcsel-led-micro-led-au-niveau-du-wafer\/\" >\n\t\t\t\tTrooper-BI Handler de Burn-in pour VCSEL\/LED\/Micro LED au Niveau du Wafer\t\t\t<\/a>\n\t\t<\/h3>\n\t\t\t\t<div class=\"elementor-post__excerpt\">\n\t\t\t<p>Trooper-BI Syst\u00e8me de test de Burn-in au Niveau du Wafer pour VCSEL\/LED\/Micro LED Il s&rsquo;agit d&rsquo;une solution cl\u00e9 en main pour sonder et soumettre au<\/p>\n\t\t<\/div>\n\t\t\t\t\t<div class=\"elementor-post__read-more-wrapper\">\n\t\t\n\t\t<a class=\"elementor-post__read-more\" href=\"https:\/\/4jmsolutions.com\/fr\/equipement\/semiconducteur-detection-composants-discrets\/tests-et-finitions\/deverminage\/trooper-bi-handler-de-burn-in-pour-vcsel-led-micro-led-au-niveau-du-wafer\/\" aria-label=\"Read more about Trooper-BI Handler de Burn-in pour VCSEL\/LED\/Micro LED au Niveau du Wafer\" tabindex=\"-1\" >\n\t\t\tRead More \u00bb\t\t<\/a>\n\n\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/article>\n\t\t\t\t<\/div>\n\t\t\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t<\/div>\n\t\t","protected":false},"excerpt":{"rendered":"<p>Handler de Burn-in pour Dispositifs de Puissance au Niveau du Wafer Il s&rsquo;agit du dernier syst\u00e8me de test de Burn-in au niveau du wafer con\u00e7u pour les dispositifs de puissance. Ce testeur innovant permet d&rsquo;accueillir 2 tests d&rsquo;eau en parall\u00e8le et 480 tests de puces en parall\u00e8le par wafer. Canaux de pilotage ind\u00e9pendants pour la [&hellip;]<\/p>\n","protected":false},"author":3,"featured_media":13453,"parent":14867,"menu_order":244,"comment_status":"closed","ping_status":"closed","template":"","meta":{"footnotes":""},"industry":[],"maincategory":[],"package":[],"process-features":[],"sub-category":[],"acf":[],"yoast_head":"<!-- This site is optimized with the Yoast SEO Premium plugin v20.5 (Yoast SEO v22.1) - https:\/\/yoast.com\/wordpress\/plugins\/seo\/ -->\n<title>Handler de Burn-in pour Dispositifs de puissance au niveau du Wafer - 4JMSolutions<\/title>\n<meta name=\"description\" content=\"It is the latest wafer-level burn in test system designed for power devices. 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