Trooper-V Wafer-Level AOI Handler for Semiconductors

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Trooper-V Wafer-Level AOI Handler for Semiconductors

Trooper-V is next level high speed AOI handler designed for wafer-level packages. In just 2 minutes, trooper v inspection system Is able to inspect an entire wafer consisting of approximately 70,000 dies with high quality objective lens it allows for different levels of magnification to accommodate various types & sizes of dies to available in different designs depending on our customer’s requirements one which allows it to Operate in cleanrooms (Class level 10) and the other which is operate-able in standard production floors.

Wafer Per Hour +30 Wafers
Raw Wafer (6, 8″ or 12″) Mylar Wafer Ring (6, 8″ or 12)
Advanced Microscope with both Bright & Dark Field Capability
High quality Objective Lens (2.0x 5.0X 7 magnification)
Light Source Illumination with RGB Configuration
Short Wave infrared (SWIR) imagıng Technology for SiC
Customizable wafer Map Generation
Integrate-able with multiple wafer size handling
Pre-Wafer Alignment X Y Angle
Die Surface Inspection (Scratch Crack, Chipping Metal Peeling, Misaligned Cut Foreign Material Missing Die Edge Bur Edge Debris, Optical Character Recognition Polyimide Peeling Vision Capabilities’ Discoloration and Contamination)

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Company

4JMSolutions (Malta) Ltd. was founded in 2008 on a solid base of international servicing and more than 25 years of high end industrial experience. Based on the solid principal of providing solutions where the equipment offered is a biproduct of the solution.