
Trooper-BI Wafer-Level VCSEL/LED/Micro LED Burn-in handler
Trooper-BI Wafer-Level VCSEL/LED/Micro LED Burn-in Test System It is a full turnkey solution to probe & bum-in VCSEL LED substrate in wafer level. The tester
Trooper-BI Wafer-Level VCSEL/LED/Micro LED Burn-in Test System It is a full turnkey solution to probe & bum-in VCSEL LED substrate in wafer level. The tester
Wafer-Level Power device Burn-in Handler It is the latest wafer-level burn in test system designed for power devices This innovative tester accommodates 2 water test
Module-Level Power Device Burn-in Handler It is the latest module-level burn-in test system designed for power devices his innovate tester accommodates 720 power module test
JTS-61X0 8 para Burn-in Sorter PKG Burn-in Board Loading / Unloading PKG Loading / Unloading / Exchange Mode Unloading IC with Bin sorting capablity DC
JTS-8700 16 Para Burn-In Sorter IC Burn-in Board Loading / Unloading IC Loading/Unloading/Exchange Mode Unloading IC with Bin sorting capablity BGA, CSP, LGA, QFP, QFN,
JTS-30K 24 Para Burn-In Sorter IC Burn-In Board loading / Unloading IC Loading/Unloading/Exchange Mode Unloading PKG with Bin sorting capability Reject Sorting by DC Test
JTS-30000 24 para Burn-in Sorter IC Burn-in Board Loading / Unloading IC Loading/Unloading/Exchange Mode Unloading IC with Bin sorting capability DC Test & Reject Sorting
JTS-8500 8 Para Burn-In Sorter IC Burn-in Board Loading / Unloading IC Loading / Unloading / Exchange Mode Unloading IC with Bin sorting capablity TSOP
JLU-2002 4 Para Burn-In Sorter IC Burn-in Board Loading / Unloading IC Loading / Unloading / Exchange Mode Unloading IC with Bin sorting capability TSOP
Eagle S2200 2 Para Burn-In Sorter IC Burn-in Board Loading / Unloading IC Loading / Unloading / Exchange Mode Socket Type : Clamshell type socket
Eagle S8800 10(12) Para Burn-in Sorter PKG Burn-in Board Loading / Unloading PKG Loading / Unloading / Exchange Mode Unloading IC with Bin Sorting Capability
Burn In Sorter Burn in Sorter is a cell with the oven to carry out the test process, and the stress tests at high temperatures
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