Module-Level Power Device Burn-in Handler
Module-Level Power Device Burn-in Handler It is the latest module-level burn-in test system designed for power devices his innovate tester accommodates 720 power module test
Home / Equipment / Semiconductor Machines And Manufacturing Equipment / Test and Finishing / Burn-In / Wafer-Level Power device Burn-in Handler
It is the latest wafer-level burn in test system designed for power devices This innovative tester accommodates 2 water test parallelism 480 die test parallelism per wafer. Independent driver channels for Simultaneous voltage/current measurement as well as temperature monitoring. Designed with a seal chamber to accommodate inert gas such as nitrogen and arc suppression gasses. It protects the DUTs from arc & Oxidation while keeping the tester in an operational
temperature state without overheating.
Module-Level Power Device Burn-in Handler It is the latest module-level burn-in test system designed for power devices his innovate tester accommodates 720 power module test
Trooper-BI Wafer-Level VCSEL/LED/Micro LED Burn-in Test System It is a full turnkey solution to probe & bum-in VCSEL LED substrate in wafer level. The tester
4JMSolutions (Malta) Ltd. was founded in 2008 on a solid base of international servicing and more than 25 years of high end industrial experience. Based on the solid principal of providing solutions where the equipment offered is a biproduct of the solution.