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4JMSolutions provides, by far, the largest selection of Test solutions. All sourced from leading ATE Manufactures at the Top of their respective field. Multiple selections to choose from for Wafer, Die and Package. Pick and Place handlers, Turret Handlers and Hybrids used for Stimulus Handlers, Optical and Photonics, High Power, Discrete Components, MEMS, Sensors, LED, Memory, Automotive and much more.

Our experienced staff will surely be able to provide a turkey solution for your needs and requirements. 

Sensors

Proximity Sensor

Proximity Sensor Our GIDEON series comprise of a single tray to tray handler which is dock-able onto either a single test cell or up to

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Image Sensor

Image Sensor Our GIDEON series comprise of a single tray to tray handler which is dock-able onto either a single test cell or up to

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Spectrum Sensor

Spectrum Sensor Our GIDEON series comprise of a single tray to tray handler which is dock-able onto either a single test cell or up to

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Micro LED

Micro LED Our GIDEON series comprise of a single tray to tray handler which is dock-able onto either a single test cell or up to

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LIDAR Sensor

LIDAR Sensor LiDAR which stands for Light Detection and Ranging is essentially a sonar that use pulsed laser waves to map the distance to Surrounding

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Motion Sensor

Motion Sensor A full turnkey solution designed to solve the complex test of MEMS motion sensors uses both a flexible flipper & rotator to simulate

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Wafer-Level VCSEL

Diffractive Optical Element and Micro Lens Array

Power Device

Power Module

Discrete and ICs

Pick and Place Test Handler

Tri-Temp Handler SX2400

Tri-Temp Handler SX2400 “World’s Best” Multi-channel high speed Tri-Temp Handler. Continuous long hours of operation time(72hrs) Archive high performance and Low Jam rate 1/5,000 Low

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System LSI

JLS-3100 Global Test Handler

JLS-3100 Global Test Handler High Contact Force (1000 kgf) Individual Temperature Control Function Direct Heater Heating Method Easy Operation, Easy Maintenance Main Power : 200-240VAC

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Dumping Systems

Auto Lot Merge

SSD

LED Probe

LED Sorter

Memory Testing Handler

Memory Testing Handler

Memory Testing Handler The package test measures the electrical characteristics, functional characteristics, and operating speed of the product by putting the semiconductor into the tester

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