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Test Handler Machines

At 4JMSolutions, we specialize in next-generation test handler machines, specifically designed for wafer die and package vision and electrical tests. We understand that in the rapidly advancing realm of semiconductors, precision and efficiency are paramount. Thus, we’ve introduced an array of specialized equipment that leverages the cutting edge in semiconductor testing equipment.

Our flagship GIDEON series stand out as a testament to our commitment to innovation. This series consists of single tray-to-tray handlers, impeccably integrated to dock onto up to three test cells. This ensures unmatched flexibility and reusability, adapting to ever-evolving semiconductor requirements. Such test handler semiconductor machines are a testament to our expertise, handling a plethora of smart sensors, including Structured Light 3D Sensors, Proximity Sensors, Time of Flight 3D Sensors, Ambient Light Sensors, and beyond.

What makes our machines stand out? Take the Structured Light 3D Sensor Machine, for instance. It offers a UPH ranging from 600 to 1200, contingent on the package and machine configuration. This handler provides both JEDEC Tray input and output, ensuring seamless integration into existing systems. Moreover, the advanced Vision Capabilities feature ensures impeccable 2D Matrix Inspection, boasting an accuracy down to 0.3mmX 0.3mm. The six-sided AOI Inspection coupled with the vision accuracy of 10µm ensures that no defect goes unnoticed.

Yet, it’s not just about vision capabilities. Our test capabilities encompass comprehensive tests like LIV Sweep & Wavelength Test, incorporating parameters like Current Leakage, Forward Voltage, Power Conversion Efficiency (PCE), and more. For comprehensive coverage, the Time of Flight 3D Sensor Machine includes a Tri-Temperature Test ranging from -40C to 150C.

Moreover, 4JMSolutions extends its prowess to the Image Sensor Test Machine, crafted for specialized tests such as the Electrical Functional Test and the Edge Spatial Frequency Response. The Micro LED Test Machine, on the other hand, is perfectly equipped for exhaustive tests like the Colorimeter Image Test and the Electrical Functional Test, ensuring every semiconductor aspect is comprehensively analyzed.

For those seeking advanced power solutions, the Wafer-Level Power device Burn-in Test Handler Machine and the Module-Level Power Device Burn-in Test Handler Machine offer unmatched capabilities. With up to 480 die test parallelism per wafer and 720 power module test parallelism respectively, they represent the pinnacle of efficiency.

Sensors

Motion Sensor

Motion Sensor A full turnkey solution designed to solve the complex test of MEMS motion sensors uses both a flexible flipper & rotator to simulate

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LIDAR Sensor

LIDAR Sensor LiDAR which stands for Light Detection and Ranging is essentially a sonar that use pulsed laser waves to map the distance to Surrounding

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Micro LED

Micro LED Our GIDEON series comprise of a single tray to tray handler which is dock-able onto either a single test cell or up to

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Spectrum Sensor

Spectrum Sensor Our GIDEON series comprise of a single tray to tray handler which is dock-able onto either a single test cell or up to

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Image Sensor

Image Sensor Our GIDEON series comprise of a single tray to tray handler which is dock-ableonto either a single test cell or up to 3

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Proximity Sensor

Proximity Sensor Our GIDEON series comprise of a single tray to tray handler which is dock-able onto either a single test cell or up to

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Wafer-Level VCSEL

Diffractive Optical Element and Micro Lens Array

Power Device

Power Module

Discrete and ICs

Pick and Place Test Handler

Tri-Temp Handler SX2400

Tri-Temp Handler SX2400 “World’s Best” Multi-channel high speed Tri-Temp Handler. Continuous long hours of operation time(72hrs) Archive high performance and Low Jam rate 1/5,000 Low

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System LSI

JLS-3100 Global Test Handler

JLS-3100 Global Test Handler High Contact Force (1000 kgf) Individual Temperature Control Function Direct Heater Heating Method Easy Operation, Easy Maintenance Main Power : 200-240VAC

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Dumping Systems

Auto Lot Merge

SSD

LED Probe

LED Sorter

Memory Testing Handler

Memory Testing Handler

Memory Testing Handler The package test measures the electrical characteristics, functional characteristics, and operating speed of the product by putting the semiconductor into the tester

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