Trooper-BI Wafer-Level VCSEL/LED/Micro LED Burn-in Test Handler

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Trooper-BI Wafer-Level VCSEL/LED/Micro LED Burn-in Test Handler

It is the latest wafer-level burn in test system designed for power devices This innovative tester accommodates 2 wafer test parallelism 480 die test parallelism per wafer. Independent driver channels for Simultaneous voltage/current measurement as well as temperature monitoring. Designed with a seal chamber to accommodate inert gas such as nitrogen and arc suppression gasses. It protects the DUTs from arc & Oxidation while keeping the tester in an operational
temperature state without overheating.

Test Handler
Incorporated with fully automated handlers
All in one solution with built-in test chambers
High-level User Defined Burn-in Profile (Continuous or Pulse Mode)
Integrated with Nitrogen Gas Cooling System
Easy Load & Unloading of Substrate Tiles
Programmable Temperature Profile
Input/Output: Wafer
UPH is up to 720 units
Burn-In duration is Programmable
Drain Voltage Sourcing: Up to 3,000V DC
Test Parameters Vth, IGSS, IDSS, VDSon
Leakage Current Measurement Accuracy: 1%
Temperature Rise Time: 15 minutes (based on room temp to 150 C)
Temperature Tolerance +5°C

INDUSTRY

SUB-CATEGORY

PROCESS & FEATURES

PACKAGES

Module-Level Power Device Test Handler

Module-Level Power Device Burn-in Test Handle It is the latest module-level burn-in test system designed for power devices his innovate tester accommodates 720 power module

Wafer-Level Power device Burn-in Test Handler

Wafer-Level Power device Burn-in Test Handler It is the latest wafer-level burn in test system designed for power devices This innovative tester accommodates 2 wafer

Company

4JMSolutions (Malta) Ltd. was founded in 2008 on a solid base of international servicing and more than 25 years of high end industrial experience. Based on the solid principal of providing solutions where the equipment offered is a biproduct of the solution.