Home / Equipment / Semiconductor Machines And Manufacturing Equipment / Test and Finishing / Test Handler / Wafer-Level Power device Burn-in Test Handler
It is the latest wafer-level burn in test system designed for power devices This innovative tester accommodates 2 wafer test parallelism 480 die test parallelism per wafer. Independent driver channels for Simultaneous voltage/current measurement as well as temperature monitoring. Designed with a seal chamber to accommodate inert gas such as nitrogen and arc suppression gasses. It protects the DUTs from arc & Oxidation while keeping the tester in an operational
temperature state without overheating.
PM52-T Power Module Test Handler A linear pick & place concept test handler designed to perform high current & power test onto Intelligent Power Modules
4JMSolutions (Malta) Ltd. was founded in 2008 on a solid base of international servicing and more than 25 years of high end industrial experience. Based on the solid principal of providing solutions where the equipment offered is a biproduct of the solution.