4jmslogo

Raw Wafer Mapping

YSystems Logo

You can't improve what you can't measure...

That's why we keep adding more measurement methods. At Y Systems, we strive to be at the cutting edge of both reproducibility and sensitivity of material property measurements. Whether for in-situ observation, external measurement, or for research, we offer fully automatic measuring equipment for production.

Phosphor Material Characterization

Conventional white LEDs are fabricated from a combination of blue emitting diodes and yellow phosphorescent material.
Some of the blue light is absorbed to make yellow light, and some is transmitted.
A precise ration of blue and yellow is required to make a specific white.

YWafer-YB (yellow and blue) was built on the fundamental design of the YWafer-GS transmission measurement mapping where the broad
band transmission source was replaced with a standard blue LED typically used to make the above type of white light emitting diodes.

YB-Concept

Conventional white LEDs are fabricated from a combination of blue emitting diodes and yellow phosphorescent material.
Some of the blue light is absorbed to make yellow light, and some is transmitted.
A precise ration of blue and yellow is required to make a specific white.

YWafer-YB (yellow and blue) was built on the fundamental design of the YWafer-GS transmission measurement mapping where the broad
band transmission source was replaced with a standard blue LED typically used to make the above type of white light emitting diodes.

YB-Concept Software
Wafer color coordinate dispersion analysis

Wafer Mappers

YWafer Mapper GS4
100x100mm area (2 to 4 inch wafer) photoluminescence, epitaxial layer thickness mapping, wafer curvature measurement system and more for LED/LD, sensor materials, phosphors in R&D and production. Features up to 5 pre-installed photoluminescence laser excitation sources, transmitivity, reflectivity measurement in one extremely compact design.
 
YWafer Mapper RD8
200x200mm area (2 to 8 inch wafer) photoluminescence, epitaxial layer thickness mapping, wafer curvature measurement system and more for LED/LD, sensor materials, phosphors in R&D and production. Multiple options for pre-installed photoluminescence laser excitation sources, transmittivity, reflectivity measurement in one extremely compact design.
YWafer Mapper RD8-WL
Robotic wafer loading equipped RD8. The clean robot may handle either 2 to 6 inch wafers (RD8-WL26) or 4 to 8 inch wafers (RD8-WL48). 200x200mm area (2 to 8 inch wafer) photoluminescence, epitaxial layer thickness mapping, wafer curvature measurement system and more for LED/LD, sensor materials, phosphors in R&D and production. Multiple options for pre-installed photoluminescence laser excitation sources, transmittivity, reflectivity measurement in one extremely compact design.
Request More Information

Company

4JMSolutions (Malta) Ltd. was founded in 2008 on a solid base of international servicing and more than 25 years of high end industrial experience. Based on the solid principal of providing solutions where the equipment offered is a biproduct of the solution.

Industries

Semiconductor, Sensor & Discrete Components
SMT Production
PCB Production
Factory Automatization Solutions

More Info

About Us
Careers
Privacy Policy
Terms & Conditions
Cookie Policy (EU)
Information Security Policy
Quality Policy

Contact Us

  • 36A, Triq Bordin,
  • Pieta, Malta
  • PTA 1230

Follow Us

© 2023 4JMSolutions. All rights reserved.