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Raw Wafer Mapping

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You can't improve what you can't measure...

That's why we keep adding more measurement methods. At Y Systems, we strive to be at the cutting edge of both reproducibility and sensitivity of material property measurements. Whether for in-situ observation, external measurement, or for research, we offer fully automatic measuring equipment for production.

Phosphor Material Characterization

Conventional white LEDs are fabricated from a combination of blue emitting diodes and yellow phosphorescent material.
Some of the blue light is absorbed to make yellow light, and some is transmitted.
A precise ration of blue and yellow is required to make a specific white.

YWafer-YB (yellow and blue) was built on the fundamental design of the YWafer-GS transmission measurement mapping where the broad
band transmission source was replaced with a standard blue LED typically used to make the above type of white light emitting diodes.

YB-Concept

In order to properly characterize the phosphor emission and light dispersion, multiple angles of measurement are provided.
(typically 45 or 60 degree from normal).
This allows detailed analysis of the color coordinate dispersion across the wafer.

YB-Concept Software
Wafer color coordinate dispersion analysis

YWafer YB is designed to provide the best reproducibility in wafer to wafer comparison and aims to help phosphor plat
makers attain the uniformity and color target for white LED fabrication.

Both YWafer GS4 and RD8 can be configured for phosphor characterization, but only RD8 can also be configured to measure the phosphor thickness, another important parameter.

Wafer Mappers

YWafer Mapper GS4
100x100mm area (2 to 4 inch wafer) photoluminescence, epitaxial layer thickness mapping, wafer curvature measurement system and more for LED/LD, sensor materials, phosphors in R&D and production. Features up to 5 pre-installed photoluminescence laser excitation sources, transmitivity, reflectivity measurement in one extremely compact design.
 
YWafer Mapper RD8
200x200mm area (2 to 8 inch wafer) photoluminescence, epitaxial layer thickness mapping, wafer curvature measurement system and more for LED/LD, sensor materials, phosphors in R&D and production. Multiple options for pre-installed photoluminescence laser excitation sources, transmittivity, reflectivity measurement in one extremely compact design.
YWafer Mapper RD8-WL
Robotic wafer loading equipped RD8. The clean robot may handle either 2 to 6 inch wafers (RD8-WL26) or 4 to 8 inch wafers (RD8-WL48). 200x200mm area (2 to 8 inch wafer) photoluminescence, epitaxial layer thickness mapping, wafer curvature measurement system and more for LED/LD, sensor materials, phosphors in R&D and production. Multiple options for pre-installed photoluminescence laser excitation sources, transmittivity, reflectivity measurement in one extremely compact design.