Module-Level Power Device Test Handler

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Module-Level Power Device Burn-in Test Handle

It is the latest module-level burn-in test system designed for power devices his innovate tester accommodates 720 power module test parallelism under modules tray to-tray forms, consisting of independent driver channels for simultaneous voltage/current measurement as well as temperature monitoring. The Bum-in test handler is designed with seal chamber to accommodate nitrogen. It protects the DUTs oxidation while keeping the tester in an operational temperature state without Overheating.

Incorporated with fully automated handlers
All in one solution with built-in test chambers
High-level User Defined Burn-in Profile (Continuous or Pulse Mode)
Integrated with Nitrogen Gas Cooling System
Easy Load & Unloading of Substrate Tiles
Programmable Temperature Profile
Input/Output: JEDEC tray
Chanel Number up to 2040 units
Burn-In duration is Programmable
Leakage Current 600V-3,000V DC
Drain Voltage Sourcing
Test Parameters Vth, IGSS, IDSS, VDSon
Leakage Current Measurement Accuracy: 1%
Temperature Rise Time: 4 minutes (based on room temp to 150 C)
Temperature Tolerance +/-5°C

PM52-T Power Module Test Handler

PM52-T Power Module Test Handler A linear pick & place concept test handler designed to perform high current & power test onto Intelligent Power Modules

Wafer-Level Power device Burn-in Test Handler

Wafer-Level Power device Burn-in Test Handler It is the latest wafer-level burn in test system designed for power devices This innovative tester accommodates 2 wafer

Company

4JMSolutions (Malta) Ltd. was founded in 2008 on a solid base of international servicing and more than 25 years of high end industrial experience. Based on the solid principal of providing solutions where the equipment offered is a biproduct of the solution.