JLS-3000 Automatic Pick & Place System for Pre-Inspected Wafer

Home / Equipment / Semiconductor Machines And Manufacturing Equipment / Test and Finishing / Test Handler / JLS-3000 Automatic Pick & Place System for Pre-Inspected Wafer

JLS-3000

16 Para System LSI Test Handler
Sorter capability can be adopted on final stage of process
Efficient design of Loading, Shuttle, Test Site, Unloading
Application : FBGA,BGA, QFP, ULGA
Using MMI Menu : Easy Set-up, Operation, Easy Maintenance
Main Power : 220V±10%, 50/60Hz, 3Phase
Air Pressure : 4~6 ㎏/㎠ (Supply Inlet Port : Ø 12×2)
M/C Dimension : 2350 (L) x 1750 (W) x 2200 (H)
Weight : Approx. 3,550 ㎏

JLS-3100 Global Test Handler

JLS-3100 Global Test Handler High Contact Force (1000 kgf) Individual Temperature Control Function Direct Heater Heating Method Easy Operation, Easy Maintenance Main Power : 200-240VAC

JAC-64K 64 Para System LSI Test Handler

JAC-64K 64 Para System LSI Test Handler Sorter capability can be adopted on final stage of process Efficient design of Loading, Shuttle, Test Site, Unloading

Company

4JMSolutions (Malta) Ltd. was founded in 2008 on a solid base of international servicing and more than 25 years of high end industrial experience. Based on the solid principal of providing solutions where the equipment offered is a biproduct of the solution.