Wafer-Level Power device Burn-in Handler
Wafer-Level Power device Burn-in Handler It is the latest wafer-level burn in test system designed for power devices This innovative tester accommodates 2 water test
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It is the latest module-level burn-in test system designed for power devices his innovate tester accommodates 720 power module test parallelism under modules tray to-tray forms, consisting of independent driver channels for simultaneous voltage/current measurement as well as temperature monitoring. The Bum-in test handler is designed with seal chamber to accommodate nitrogen. It protects the DUTs oxidation while keeping the tester in an operational temperature state without Overheating.
Wafer-Level Power device Burn-in Handler It is the latest wafer-level burn in test system designed for power devices This innovative tester accommodates 2 water test
Trooper-BI Wafer-Level VCSEL/LED/Micro LED Burn-in Test System It is a full turnkey solution to probe & bum-in VCSEL LED substrate in wafer level. The tester
4JMSolutions (Malta) Ltd. was founded in 2008 on a solid base of international servicing and more than 25 years of high end industrial experience. Based on the solid principal of providing solutions where the equipment offered is a biproduct of the solution.