Double Sided Wafer Prober
The PCP-102WS is a high precision prober designed to contact both sides (double side) of wafer.
By adopting PFC original XY Compensation and Profiling function, PCP-102WS can compensate the position even if a wafer is warped.
Accurate RDS (on-resistance) is measured by making Kelvin connection at the drain side on the back of wafer and adjusting its drain-sense-position to the source-sense-position.
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Wafer size |
100mm (4 inch) to 200mm (8 inch) |
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Probing area |
Wafer: φ200mm |
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XY stage |
Driven by linear motor (Repeat accuracy:1um) |
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Footprint |
Small space: (W)1200mm × (D)860mm |
4JMSolutions (Malta) Ltd. was founded in 2008 on a solid base of international servicing and more than 25 years of high end industrial experience. Based on the solid principal of providing solutions where the equipment offered is a biproduct of the solution.
