JAP-3100 Pick & Place System with Vision inspection
JAP-3100 Pick & Place System with Vision inspection Automatic Pick & Place System with Vision inspection Wafer handling by magazine : Auto Wafer Loading &
Home / Equipment / Semiconductor Machines And Manufacturing Equipment / Front-End / Wafer Sorter with AOI / C340 Wafer Sorter Wafer to Tape and Reel
JAP-3100 Pick & Place System with Vision inspection Automatic Pick & Place System with Vision inspection Wafer handling by magazine : Auto Wafer Loading &
Optimus 2 Wafer to Wafer [Single input – Dual output] Wafer Sorter Wafer to Wafer Vision-aided die position correction ensures die placement accuracy Integrated vibration
Optimus MR3 Wafer to Wafer Wafer Sorter Wafer to Wafer SUPH up to 15,000 Die Size 0.5×0.5mm to 15x15mm Placement Accuracy +/- 30µm 6Side Inspection
FS500 Die Transfer Wafer to JEDEC Tray Wafer Sorter Component Transfer from Magazine to Jedec Tray SUPH up to 5,000 Die Size 3x3mm to 10x10mm
C330 Wafer to Tape and Reel Wafer sorter Wafer to Tape & Reel SUPH up to 30,000 (Flip mode) Die Side Wall Inspection ≥10µm Defect
C530 Wafer to Tape and Reel Wafer Sorter Wafer to Tape & Reel SUPH up to 45,000 Die Size: 0.2×0.4mm to 8x8mm SWIR / NIR
4JMSolutions (Malta) Ltd. was founded in 2008 on a solid base of international servicing and more than 25 years of high end industrial experience. Based on the solid principal of providing solutions where the equipment offered is a biproduct of the solution.