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Test Probes

4JMSolutions carry a wide range of test probes (both cantilever & blade) commonly use in the die-sort and wafer mapping process. Our specially designed equipment and proprietary processes enable us to produce ultra fine probes with tight tolerance specification to ensure effective and long lasting applications. Tips radius down to six(6) microns can be maintained.


  • Tungsten Rhenium (WR)
  • Tungsten (W)
  • Beryllium Copper (BeCu)
  • Paliney 7 (P7)


  • 0.20mm (8mils)
  • 0.25mm (10mils)
  • 0.50mm (20mils)

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