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[Wafer Process]
Wafer Size
100mm (4 inch) to 300mm (12 inch)
Features
High Voltage & Current Power Device testing
Full auto “Contact Checker Unit” for fail safe
Wafer Size
100mm (4 inch) to 200 mm (8 inch)
Wafer Size
150 mm (6 inch), 200 mm (8 inch)
Frame Size
2-6-1, 2-8-1 and 2-12
※1 Supports 6 inch by changing the chuck (Option)
※2 Supports 8 inch by changing the chuck (Option)
Wafer Prober
Probing Handler
Features
Combining our probing system (PCP series) and commercially available measuring instruments such as power supplies and meters, and using a dedicated PC, we build a dedicated system that controls both.
Features
Setting of probing coordinates, etc. which takes time can be done without stopping the operation of PCP series.
*1: Windows OS only.
4JMSolutions (Malta) Ltd. was founded in 2008 on a solid base of international servicing and more than 25 years of high end industrial experience. Based on the solid principal of providing solutions where the equipment offered is a biproduct of the solution.
